Current-Signature-Based Analysis of Complex Test Fails

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 1999, Pages 377-387

  Gattiker, Anne ^a   Nigh, Phil ^b   Maly, Wojciech ^c  

^a IBM AUSTIN RESEARCH LABORATORY   (United States)

^b IBM MICROELECTRONICS   (United States)

^c CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX TEST FAILS; FAULT LOCALIZATION; MULTI-TRANSISTOR BREAKDOWN MECHANISM;

ALGORITHMS; DEFECTS; FAILURE ANALYSIS; TRANSISTORS;

APPLICATION SPECIFIC INTEGRATED CIRCUITS;

EID: 1542300883     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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