Toward understanding `Iddq-only' fails

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 174-183

  Gattiker, Anne E ^a   Maly, Wojciech ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; DIES; ELECTRIC CURRENT MEASUREMENT;

CURRENT SIGNATURE; POST-BURN-IN TESTS;

INTEGRATED CIRCUIT TESTING;

EID: 0032314554     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)