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Volumn , Issue , 1999, Pages 147-154
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Toward reducing 'functional only' fails for the UltraSPARC microprocessors
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Author keywords
[No Author keywords available]
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Indexed keywords
COMBINATORIAL CIRCUITS;
COMPUTER DEBUGGING;
COMPUTER SYSTEM RECOVERY;
MICROPROCESSOR CHIPS;
RANDOM ACCESS STORAGE;
SEQUENTIAL CIRCUITS;
EXTENDED HIGH VOLTAGE STRESS;
FUNCTIONAL ONLY FAILURES;
HIGH FREQUENCY AUTOMATIC TEST PATTERN GENERATION;
SOFTWARE PACKAGE FASTSCAN;
INTEGRATED CIRCUIT TESTING;
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EID: 0033336153
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (9)
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References (12)
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