Delta Iddq for testing reliability

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2000, Pages 439-443

  Powell, Theo J ^a   Pair, James ^a   St John, Melissa ^a   Counce, Doug ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; MICROPROCESSOR CHIPS; QUALITY CONTROL; RELIABILITY; THRESHOLD VOLTAGE;

DELTA IDDQ; RELIABILITY TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0033748681     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (10)