CMOS IC reliability indicators and burn-in economics

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 194-203

  Righter, Alan W ^a   Hawkins, Charles F ^a   Soden, Jerry M ^a   Maxwell, Peter ^a  

^a ANALOG DEVICES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENT MEASUREMENT; FAILURE ANALYSIS; QUALITY ASSURANCE; RANDOM ACCESS STORAGE; RELIABILITY;

BURN-IN TESTS; RELIABILITY INDICATORS; YIELD RECLAMATION POTENTIAL;

INTEGRATED CIRCUIT TESTING;

EID: 0032320095     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (32)