Improved IDDQ testing with empirical linear prediction

IEEE International Test Conference (TC)

Volumn , Issue , 2002, Pages 954-963

  Bergman, David I ^a   Engler, Hans ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b GEORGETOWN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; DATA REDUCTION; DIGITAL CIRCUITS; INTEGRATED CIRCUIT MANUFACTURE; LEAKAGE CURRENTS; LINEAR SYSTEMS; MATHEMATICAL MODELS; STATISTICAL METHODS;

DEEP SUB-MICRON TESTING; DIGITAL CMOS CIRCUIT; LINEAR PREDICTION METHOD; STATISTICAL PRE-PROCESSING;

INTEGRATED CIRCUIT TESTING;

EID: 0036444858     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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