Current signatures for production testing [CMOS ICs]

Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996

Volumn , Issue , 1996, Pages 25-28

  Gattiker, A ^a   Nigh, P ^b   Grosch, D ^b   Maly, W ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS;

CURRENT SIGNATURES; IDDQ TESTING; PRODUCTION ENVIRONMENTS; PRODUCTION TESTING;

TIMING CIRCUITS;

EID: 84962323791     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IDDQ.1996.557804     Document Type: Conference Paper

References (4)

1. J. Acken and S. Millman, "Current Measurement Data To Demonstrate Setting Current Limits in a Complete Iddq Testing Methodology," IEEE International Workshop on Iddq Testing, October 1995, pp.
2. A. Gattiker and W. Maly, "Current Signatures," IEEE VLSI Test Symposium, April 1996, pp. 112-117.
3. D. Josephson, M. Storey and D. Dixon, "Microprocessor IDDq Testing: A Case Study," IEEE Design &Test of Computers, Summer 1995 Edition, 1995, pp.
4. M. Keating and D. Meyer, "A New Approach to Dynamic IDDq Testing," 1987 International Test Conference, September 1987, pp. 316-321.