Application of selected fundamental parameters in x-ray fluorescence analysis

X-Ray Spectrometry

Volumn 32, Issue 1, 2003, Pages 8-12

  Zhuo, Shangjun ^a   Tao, Guangyi ^a   Ji, Ang ^a  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; COPPER ALLOYS; FLUORESCENCE; GOLD ALLOYS; TERNARY ALLOYS; X RAY ANALYSIS;

BINARY COEFFICIENT; BINARY DISKS; CALIBRATION STANDARD; INFLUENCE COEFFICIENT; MEASURED VALUES; MEASURING CONDITIONS; PURE ELEMENTS; REFERENCE MATERIAL; RELATIVE ERRORS; X RAY FLUORESCENCE ANALYSIS;

SILVER ALLOYS;

EID: 0037248060     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.611     Document Type: Article

References (12)

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