Total reflection by synchrotron radiation: Trace determination in nuclear materials

X-Ray Spectrometry

Volumn 31, Issue 2, 2002, Pages 167-172

  Simabuco, S M ^a   Vazquez C ^b,c   Boeykens, S ^c   Barroso, R C ^d  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b DEPARTAMENTO DE FÍSICA   (Argentina)

^c UNIVERSIDAD DE BUENOS AIRES   (Argentina)

^d STATE UNIVERSITY OF RIO DE JANEIRO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; IMPURITIES; RADIOACTIVE MATERIALS; SYNCHROTRONS;

ANALYTICAL METHOD; CHEMICAL CONTROLS; CONTROL OF IMPURITIES; IMPURITIES IN; MATRIX; MAXIMUM CONCENTRATIONS; NUCLEAR MATERIAL; PRE-CONCENTRATION; TOTAL REFLECTION; TRACE DETERMINATION;

SYNCHROTRON RADIATION;

EID: 0036100907     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.540     Document Type: Article

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