Characterization of ultrathin Cr layers on PET by RBS and XRF

Surface and Interface Analysis

Volumn 34, Issue 1, 2002, Pages 763-766

  Draxler, M ^a   Zoister, S ^b   Kastner, F ^b   Bergsmann, M ^b   Bauer, P ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b Hueck Folien GmbH   (Austria)

Author keywords

PET; Quantitative analysis; RBS; Ultrathin films; X ray fluorescence

Indexed keywords

CHARACTERIZATION; CHROMIUM ALLOYS; DENSITY (OPTICAL); FLUORESCENCE; INTERFACES (MATERIALS); MAGNETRON SPUTTERING; METALLIZING; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING FILMS; SPUTTER DEPOSITION; THICKNESS MEASUREMENT; X RAY SPECTROSCOPY;

NANOFILMS; X RAY FLUORESCENCE SPECTROSCOPY;

POLYETHYLENE TEREPHTHALATES;

EID: 0036693510     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1406     Document Type: Conference Paper

References (5)