A new XRF spectrometer based on a ring-shaped multi-element silicon drift detector and on X-ray capillary optics

IEEE Transactions on Nuclear Science

Volumn 49 II, Issue 3, 2002, Pages 1001-1005

  Longoni, A ^b   Fiorini, C ^a,b   Guazzoni, Chiara ^a,b   Gianoncelli, A ^b   Strüder, Lothar ^c   Soltau, H ^d   Lechner, P ^d   Bjeoumikhov, A ^e   Schmalz, J ^e   Langhoff, N ^e   Wedell, R ^e  

^a IEEE

^b POLITECNICO DI MILANO   (Italy)

^c MPI HALBLEITERLABOR   (Germany)

^d KETEK GMBH   (Germany)

^e Institut fur Geratebau GmbH   (Germany)

Author keywords

Elemental mapping; Silicon drift detectors; X ray optics; X ray spectrometry; XRF

Indexed keywords

DETECTORS; FLUORESCENCE; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ANALYSIS; X RAY OPTICS; X RAYS;

CAPILLARY OPTICS; ELEMENTAL MAPPING; SILICON DRIFT DETECTORS; X RAY BEAM; X RAY FLUORESCENCE SPECTROMETER; X RAY SPECTROMETRY;

X RAY SPECTROMETERS;

EID: 0036624474     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.1039604     Document Type: Article

References (10)

1. E. Lifshin, Materials Science and Technology, R. W. Cahn, P. Haasen, and E. J. Kramer, Eds. Weinheim, 1986, pt. II, vol. 2B, ch. 16.
2. J. I. Goldstein and H. Yakowitz, Practical Scanning Electron Microscopy, New York: Plenum, 1977.
3. P. J. Statham, "Prospects for improvement in EDX microanalysis," J. Microscopy, vol. 130, pp. 165-176, 1983.
4. E. Gatti and P. Rehak, "Semiconductor drift chamber - An application of a novel charge transport scheme," Nucl. Instrum. Methods, vol. A 225, pp. 608-614, 1984.
5. P. Lechner, S. Eckbauer, R. Hartmann, S. Krisch, D. Hauff, R. Richter, H. Soltau, L. Strüder, C. Fiorini, E. Gatti, A. Longoni, and M. Sampietro, "Silicon drift detectors for high resolution room temperature X-ray spectroscopy," Nucl. Instrum. Methods, vol. A 377, pp. 346-351, 1996.
6. M. A. Kumachov, "Channeling of photons and new X-ray optics," Nucl. Instrum. Methods, vol. B48, pp. 283-286, 1990.
7. P. Lechner et al. "Silicon drift detectors for high count rate X-ray spectroscopy at room temperature," Nucl. Instrum. Methods, vol. A 458, pp. 281-289, 2001.
8. V. Radeka, P. Rehak, S. Rescia, E. Gatti, A. Longoni, M. Sampietro, G. Bertuccio, P. Holl, L. Strüder, and J. Kemmer, "Implanted silicon JFET on completely depleted high-resistivity devices," IEEE Electron Device Lett., vol. 10, no. 2, pp. 91-94, April 1989.
9. C. Guazzoni, S. Buzzetti, A. Longoni, and C. Arnaboldi, "Modular multichannel acquisition system for high-resolution X-Ray spectroscopy detectors," IEEE Trans. Nucl. Sci., vol. 49, no. 3, June 2002.
10. C. Fiorini and A. Longoni, "Application of a new noncryogenic X-ray detector in portable instruments for archaeometric analyzes," Rev. Sci. Instrum., vol. 69, no. 3, pp. 1523-1528, Mar. 1998.