Influence of heterogeneous surface morphology on analytical signal formation in total reflection x-ray fluorescence analysis

X-Ray Spectrometry

Volumn 31, Issue 3, 2002, Pages 235-238

  Alov, N V ^a   Oskolok, K V ^a  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRODES; FLUORESCENCE; GLASS CERAMICS; NUCLEATION;

ANALYTICAL SIGNALS; FLUORESCENCE LINES; HETEROGENEOUS SURFACE; LINE INTENSITIES; NUCLEATION AND GROWTH; PHASE GROWTH; PHASE NUCLEATION; SIGNAL FORMATION; TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS; X RAY FLUORESCENCE;

SURFACE MORPHOLOGY;

EID: 0036274458     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.565     Document Type: Article

References (16)

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