Study of Silicon Carbide for X-Ray Detection and Spectroscopy

IEEE Transactions on Nuclear Science

Volumn 50, Issue 1, 2003, Pages 175-185

  Bertuccio, G ^a   Casiraghi, R ^b  

^a POLITECNICO DI MILANO   (Italy)

^b STMICROELECTRONICS   (Italy)

Author keywords

detector; Schottky diodes; semiconductor radiation; silicon carbide; X ray detectors; X ray spectroscopy

Indexed keywords

DRIFT CHAMBERS; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR JUNCTIONS; SEMICONDUCTOR MATERIALS; SILICON CARBIDE; X RAY SPECTROSCOPY;

X-RAY DETECTORS;

RADIATION DETECTORS;

EID: 0037295009     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.2003.807855     Document Type: Article

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