Improvement of peak-to-background ratio in PIXE and XRF methods using thin Si-PIN detectors

X-Ray Spectrometry

Volumn 32, Issue 2, 2003, Pages 93-105

  Karydas, A G ^a   Zarkadas, Ch ^a   Kyriakis, A ^a   Pantazis, J ^b   Huber, A ^b   Redus, R ^b   Potiriadis, C ^c   Paradellis, T ^a  

^a INSTITUTE OF NUCLEAR PHYSICS   (Greece)

^b Amptek Inc   (United States)

^c GREEK ATOMIC ENERGY COMMISSION   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; INTELLIGENT SYSTEMS; MONTE CARLO METHODS; PROTON IRRADIATION; RADIOISOTOPES; SILICON COMPOUNDS; X RAY DETECTORS;

DE-EXCITATIONS; ENERGY REGIONS; ENERGY RESPONSE; PEAK-TO-BACKGROUND RATIOS; PIN DETECTOR; PROTONS IRRADIATIONS; SILICON CRYSTAL; THIN CRYSTAL; X-RAY ENERGIES; XRF ANALYSIS;

GAMMA RAYS;

EID: 0037240073     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.621     Document Type: Article

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