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Volumn 51, Issue 11, 2002, Pages 1045-1047
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Portable X-ray fluorescence spectrometer system using a low-level radioisotope 55Fe
a b c
b
Den Material Co Ltd
*
(Japan)
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Author keywords
Non destructive analysis; Portable RI X ray fluorescence spectrometer
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Indexed keywords
AMERICIUM 241;
BERYLLIUM;
IRON 55;
PIGMENT;
POTASSIUM;
RADIOISOTOPE;
SILICON;
ANALYTIC METHOD;
ARTICLE;
LOW ENERGY RADIATION;
PAINTING;
SENSITIVITY ANALYSIS;
X RAY FLUORESCENCE;
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EID: 0036440234
PISSN: 05251931
EISSN: None
Source Type: Journal
DOI: 10.2116/bunsekikagaku.51.1045 Document Type: Article |
Times cited : (1)
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References (9)
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