Defect recognition and impurity detection techniques in crystalline silicon for solar cells

Solar Energy Materials and Solar Cells

Volumn 72, Issue 1-4, 2002, Pages 441-451

  Istratov, A A ^a   Hieslmair, H ^a   Vyvenko, O F ^a   Weber, E R ^b   Schindler, R ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Lawrence Berkeley National Laboratory   (United States)

^c FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

Defect clusters; DLTS; EBIC; Solar cells; X ray fluorescence; XBIC

Indexed keywords

CRYSTAL IMPURITIES; CRYSTALLINE MATERIALS; DEEP LEVEL TRANSIENT SPECTROSCOPY; DIFFUSION; DISLOCATIONS (CRYSTALS); ELECTRIC POTENTIAL; GRAIN BOUNDARIES; TRANSITION METALS; X RAY ANALYSIS;

MULTICRYSTALLINE SOLAR CELLS;

SILICON SOLAR CELLS;

EID: 0036533370     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(01)00192-1     Document Type: Conference Paper

References (31)