SCOPUS 정보 검색 플랫폼

Solar Energy Materials and Solar Cells

Volumn 72, Issue 1-4, 2002, Pages 441-451

Defect recognition and impurity detection techniques in crystalline silicon for solar cells

(5) Istratov, A A a Hieslmair, H a Vyvenko, O F a Weber, E R b Schindler, R c

a UNIVERSITY OF CALIFORNIA (United States)

b 475 Evans Hall ^* (United States)

c FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE (Germany)

Author keywords

Defect clusters; DLTS; EBIC; Solar cells; X ray fluorescence; XBIC

Indexed keywords

CRYSTAL IMPURITIES; CRYSTALLINE MATERIALS; DEEP LEVEL TRANSIENT SPECTROSCOPY; DIFFUSION; DISLOCATIONS (CRYSTALS); ELECTRIC POTENTIAL; GRAIN BOUNDARIES; TRANSITION METALS; X RAY ANALYSIS;

MULTICRYSTALLINE SOLAR CELLS;

SILICON SOLAR CELLS;

EID: 0036533370 PISSN: 09270248 EISSN: None Source Type: Journal
DOI: 10.1016/S0927-0248(01)00192-1 Document Type: Conference Paper

Times cited : (35)

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