Chemical characterization using relative intensity of manganese Kβ' and Kβ5 X-ray fluorescence

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 199, Issue , 2003, Pages 391-395

  Sakurai, Kenji ^a   Eba, Hiromi ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Chemical effects; Detection efficiency; Energy resolution; Intensity change; Johansson type spectrometer; Synchrotron radiation; Trace element analysis; Undulator radiation; Wavelength dispersive; X ray fluorescence

Indexed keywords

CRYSTAL STRUCTURE; FLUORESCENCE; SYNCHROTRON RADIATION; TRACE ANALYSIS;

X-RAY FLUORESCENCE;

MANGANESE;

EID: 0037241050     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)01414-3     Document Type: Conference Paper

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