Parameter refinement in the analysis of X-ray irradiated samples

X-Ray Spectrometry

Volumn 31, Issue 2, 2002, Pages 173-177

  Carreras, A ^a   Bonetto, R ^b   Stutz, G ^a   Trincavelli, J ^a   Castellano, G ^a  

^a UNIVERSIDAD NACIONAL DE CÓRDOBA   (Argentina)

^b Facultad de Ciencias Naturales e Instituto M Lillo   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

ITERATIVE METHODS;

ATOMIC PARAMETER; BACKGROUND SPECTRUM; CHARACTERISTIC PEAKS; EXPERIMENTAL PARAMETERS; IRRADIATED SAMPLES; PARAMETER REFINEMENT; SPECTROSCOPIC TECHNIQUE; X RAY FLUORESCENCE; X RAY SPECTRUM; X- RAY DIFFRACTIONS;

X RAY DIFFRACTION;

EID: 0036117464     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.529     Document Type: Article

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