Perspectives on technology and technology-driven CAD

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 19, Issue 12, 2000, Pages 1544-1560

  Dutton, Robert W ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

CMOS scaling; Concurrent design; Design; Design for manufacturing; Manufacturing; Simulation; TCAD; Yield

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; CONCURRENT ENGINEERING; INTEGRATED CIRCUIT MANUFACTURE;

DEEP SUBMICROMETER (DSM) DEVICES;

INTEGRATED CIRCUIT LAYOUT;

EID: 0034428062     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.898831     Document Type: Article

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