Application of Statistical Design and Response Surface Methods to Computer-Aided VLSI Device Design

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 7, Issue 2, 1988, Pages 272-288

  Alvarez, Antonio R ^a   Abdi, Behrooz L ^a   Young, Dennis L ^b   Weed, Harrison D ^b   Teplik, Jim ^b   Herald, Eric R ^b  

^a MOTOROLA INC   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS, VLSI - COMPUTER AIDED DESIGN; MATHEMATICAL TECHNIQUES - SENSITIVITY ANALYSIS; OPTIMIZATION;

DESIGN SYNTHESIS AND ANALYSIS; DESIGNING FOR MANUFACTURABILITY; MULTIPLE INPUT-OUTPUT SYSTEM; MULTIPLE-CONSTRAINTS-OPTIMIZATION PROBLEM; RESPONSE SURFACE METHODS;

STATISTICAL METHODS;

EID: 0023964171     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.3158     Document Type: Article

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