Radiation hardened by design SRAM strategies for TID and SEE mitigation

Radiation Effects in Semiconductors

Volumn , Issue , 2010, Pages 151-194

  Clark, Lawrence T ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

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EID: 84962101654     PISSN: None     EISSN: None     Source Type: Book    
DOI: None     Document Type: Chapter

References (56)

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