메뉴 건너뛰기




Volumn 411, Issue , 2015, Pages 76-80

Characterization of semi-polar GaN on GaAs substrates

Author keywords

AFM; Non polar GaN; Semi polar GaN; TEM; XRD

Indexed keywords

BUFFER LAYERS; CRYSTAL ORIENTATION; GALLIUM ARSENIDE; GALLIUM NITRIDE; LATTICE CONSTANTS; SEMICONDUCTING GALLIUM; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84912544154     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2014.10.046     Document Type: Article
Times cited : (10)

References (58)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.