SCOPUS 정보 검색 플랫폼

International Materials Reviews

Volumn 59, Issue 3, 2014, Pages 115-131

Aberration-corrected scanning transmission electron microscopy for atomic-resolution studies of functional oxides

(2) MacLaren, Ian a,b Ramasse, Quentin M b

a UNIVERSITY OF GLASGOW (United Kingdom)

b SUPERSTEM LABORATORY (United Kingdom)

Author keywords

Aberration corrected STEM; Atomic resolution; EELS; Functional oxides; HAADF imaging; Spectroscopy

Indexed keywords

ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPIES; ABERRATION-CORRECTED STEM; ATOMIC RESOLUTION; FUNCTIONAL OXIDES; HAADF IMAGING; INTERATOMIC SPACING; OXIDE NANOSTRUCTURES; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

CHEMICAL BONDS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; NANOSTRUCTURES; SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ATOMS;

EID: 84898080635 PISSN: 09506608 EISSN: 17432804 Source Type: Journal
DOI: 10.1179/1743280413Y.0000000026 Document Type: Review

Times cited : (65)

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