Monochromated STEM with a 30 meV-wide, atom-sized electron probe

Journal of Electron Microscopy

Volumn 62, Issue 1, 2013, Pages 3-21

  Krivanek, Ondrej L ^a,b   Lovejoy, Tracy C ^a   Dellby, Niklas ^a   Carpenter, R W ^b  

^a Nion Co Kirkland   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Aberration correction; Electron monochromator; High energy resolution electron energy loss spectroscopy; Scanning transmission electron microscopy; Single atom spectroscopy; Singleatom microscopy

Indexed keywords

ABERRATIONS; ATOMS; DISSOCIATION; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MONOCHROMATORS; PROBES; SCANNING ELECTRON MICROSCOPY; SPECTROMETERS;

ABERRATION CORRECTION; ELECTRON ENERGY-LOSS SPECTROSCOPIES; ELECTRON MONOCHROMATORS; ENERGY RESOLUTIONS; HIGH-ENERGY RESOLUTION; HIGH-ENERGY-RESOLUTION ELECTRON ENERGY-LOSS SPECTROSCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SINGLE ATOM SPECTROSCOPY; SINGLE-ATOM MICROSCOPY; SINGLE-ATOMS;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 84876988728     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfs089     Document Type: Review

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