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Volumn 22, Issue 10, 2010, Pages 1156-1160

Probing interfacial electronic structures in atomic layer LaMnO3 and SrTiO3 superlattices

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATION CORRECTION; ATOMIC COLUMNS; ATOMIC LAYER; BAND ALIGNMENTS; ELECTRON PROBE; ELECTRON TRANSFER; HIGH SPATIAL RESOLUTION; INTERFACIAL ELECTRONIC STRUCTURE; O K-EDGES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SRTIO;

EID: 77949599980     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.200904198     Document Type: Article
Times cited : (70)

References (35)
  • 35
    • 77949651774 scopus 로고    scopus 로고
    • J. G. Wen, J. Mabon, C. Lei, S. Burdin, E. Sammann, I. Petrov, A. B. Shah, V. G. Chobpattana, J. Zhang, K. Ran, J. M. Zuo, S. Mishina, T. Aoki, submitted 2009
    • J. G. Wen, J. Mabon, C. Lei, S. Burdin, E. Sammann, I. Petrov, A. B. Shah, V. G. Chobpattana, J. Zhang, K. Ran, J. M. Zuo, S. Mishina, T. Aoki, submitted 2009.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.