SCOPUS 정보 검색 플랫폼

Volumn 90, Issue 35-36, 2010, Pages 4731-4749

Atomic-resolution spectroscopic imaging of oxide interfaces

(9) Kourkoutis, L Fitting a Xin, H L a Higuchi, T b Hotta, Y a,c Lee, J H a,d Hikita, Y b Schlom, D G a Hwang, H Y b,e Muller, D A a,f

a Cornell University (United States)

b UNIVERSITY OF TOKYO (Japan)

c RIKEN (Japan)

d PENNSYLVANIA STATE UNIVERSITY (United States)

e JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

f Department of Theoretical and Applied Mechanics and the Cornell Nanofabrication Facility (United States)

Author keywords

electron energy loss spectroscopy; interface properties; perovskites; scanning transmission electron microscopy; spectroscopic imaging

Indexed keywords

ATOMIC RESOLUTION; ATOMIC SCALE; BULK-LIKE; BURIED INTERFACE; CORE-LEVEL ELECTRONS; DELOCALIZATION EFFECTS; ELECTRONIC PHASIS; FINE STRUCTURES; HETEROSTRUCTURES; INTER-DIFFUSION; INTERFACE PROPERTY; MACROSCOPIC PROPERTIES; OXIDE HETEROSTRUCTURES; OXIDE INTERFACES; PEROVSKITE OXIDES; RESOLUTION LIMITS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPECTROSCOPIC IMAGING;

AMORPHOUS MATERIALS; ATOMIC SPECTROSCOPY; ATOMS; DISSOCIATION; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; HETEROJUNCTIONS; NUCLEAR INSTRUMENTATION; PEROVSKITE; PHASE INTERFACES; TRANSITION METALS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 77958581487 PISSN: 14786435 EISSN: 14786443 Source Type: Journal
DOI: 10.1080/14786435.2010.518983 Document Type: Conference Paper

Times cited : (62)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.