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Volumn 24, Issue 29, 2012, Pages 3952-3957

Electron transfer and ionic displacements at the origin of the 2D electron gas at the LAO/STO interface: Direct measurements with atomic-column spatial resolution

Author keywords

charge transport; epitaxy; oxide interfaces; structure property relationships; thin films

Indexed keywords

2D ELECTRON GAS; ABERRATION-CORRECTED; ATOMIC SCALE; DIRECT MEASUREMENT; ELECTRON TRANSFER; EXPERIMENTAL EVIDENCE; INTRINSIC ELECTRONICS; IONIC DISPLACEMENT; OXIDE INTERFACES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIMULTANEOUS MEASUREMENT; SPATIAL RESOLUTION; STRUCTURE PROPERTY RELATIONSHIPS;

EID: 84864401952     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201200667     Document Type: Article
Times cited : (146)

References (38)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.