Near-simultaneous dual energy range EELS spectrum imaging

Ultramicroscopy

Volumn 108, Issue 12, 2008, Pages 1586-1594

  Scott, J ^a   Thomas, P J ^b   MacKenzie, M ^a   McFadzean, S ^a   Wilbrink, J ^b   Craven, A J ^a   Nicholson, W A P ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

^b GATAN INC   (United States)

Author keywords

Electron energy loss spectroscopy; Nanoanalysis; Spectrum imaging; STEM

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; CONCURRENCY CONTROL; DATA STORAGE EQUIPMENT; PIXELS;

CONTROL SIGNALLING; CORE LOSSES; DRIFT CORRECTION; DUAL-ENERGY; ENERGY REGIONS; HIGH-QUALITY; IMAGING DETECTORS; LOW LOSS SPECTRUM; LOW LOSSES; NANOANALYSIS; PER UNIT VOLUME; SPECTRUM IMAGING; STEM; SUB PIXELS; SYNCHRONISATION; X-RAY SPECTRUM;

ELECTRON ENERGY LOSS SPECTROSCOPY;

ARTICLE; DUAL ENERGY X RAY ABSORPTIOMETRY; ELECTRICITY; ELECTRON ENERGY LOSS SPECTROSCOPY; ROENTGEN SPECTROSCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 53249145579     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.05.006     Document Type: Article

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