Evidence of sharp and diffuse domain walls in BiFeO 3 by means of unit-cell-wise strain and polarization maps obtained with high resolution scanning transmission electron microscopy

Physical Review Letters

Volumn 109, Issue 4, 2012, Pages

  Lubk, A ^a   Rossell, M D ^b   Seidel, J ^e   He, Q ^c   Yang, S Y ^c   Chu, Y H ^c,d   Ramesh, R ^c   Hytch M J ^a   Snoeck, E ^a  

^a UNIVERSITÉ DE TOULOUSE   (France)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^c University of California Berkeley   (United States)

^d NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^e LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO CALCULATIONS; HIGH RESOLUTION SCANNING; HIGH-ANGLE ANNULAR DARK FIELDS; LOCAL ATOMIC STRUCTURES; LOCAL POLARIZATION; POLARIZATION SWITCHING; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

FERROELECTRIC MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

POLARIZATION;

EID: 84864196965     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.109.047601     Document Type: Article

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