Semi-analytical current source modeling of FinFET devices operating in near/sub-threshold regime with independent gate control and considering process variation

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Volumn , Issue , 2014, Pages 167-172

  Cui, Tiansong ^a   Wang, Yanzhi ^a   Lin, Xue ^a   Nazarian, Shahin ^a   Pedram, Massoud ^a  

^a University of Southern California ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT SOURCE MODELING; CURRENT SOURCE MODELS (CSM); LOW-POWER CONSUMPTION; ON/OFF CURRENT RATIO; PROCESS VARIATION; PROCESS-INDUCED VARIATION; STATISTICAL STATIC TIMING ANALYSES (SSTA); TIME/SPACE COMPLEXITY;

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; ENERGY UTILIZATION; INTEGRATED CIRCUITS; MOSFET DEVICES; SENSITIVITY ANALYSIS; TIMING CIRCUITS; TIMING DEVICES;

PROCESS CONTROL;

EID: 84897873882     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASPDAC.2014.6742884     Document Type: Conference Paper

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