Utilizing reverse short-channel effect for optimal subthreshold circuit design

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 15, Issue 7, 2007, Pages 821-828

  Kim, Tae Hyoung ^a,b   Keane, John ^a,b   Eom, Hanyong ^b   Kim, Chris H ^a,b  

^a IEEE   (United States)

^b University of Minnesota   (United States)

Author keywords

Circuit optimization; Process variation; Reverse short channel effect (RSCE); Subthreshold operation

Indexed keywords

CRITICAL PATH DELAY; EXPONENTIAL DEPENDENCY; REVERSE SHORT-CHANNEL EFFECT (RSCE);

ASYMPTOTIC STABILITY; CHANNEL STATE INFORMATION; COMPUTER SIMULATION; DRAIN CURRENT; ELECTRIC POWER UTILIZATION; THRESHOLD VOLTAGE;

INTEGRATED CIRCUIT LAYOUT;

EID: 34347237842     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2007.899239     Document Type: Article

References (16)

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