Leakage current mechanisms and leakage reduction techniques in deep-submicrometer CMOS circuits

Proceedings of the IEEE

Volumn 91, Issue 2, 2003, Pages 303-

  Roy, Mukhopadhyay ^a   Mahmoodi Meimand, ^a  

^a NONE

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EID: 33646864552     PISSN: 00189219     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPROC.2003.808154     Document Type: Editorial

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