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Volumn 102, Issue 3, 2007, Pages

Measurement of Poisson's ratio with contact-resonance atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; FUSED SILICA; STIFFNESS;

EID: 34548022867     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2767387     Document Type: Article
Times cited : (59)

References (26)
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    • Drobek, T.1    Stark, R.W.2    Heckl, W.M.3
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    • 0021-8979 10.1063/1.1876576
    • Y. Song and B. Bhushan, J. Appl. Phys. 0021-8979 10.1063/1.1876576 97, 083533 (2005).
    • (2005) J. Appl. Phys. , vol.97 , pp. 083533
    • Song, Y.1    Bhushan, B.2
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    • 34548044172 scopus 로고    scopus 로고
    • edited by B.Bhushan and H.Fuchs (Springer, New York
    • U. Rabe, in Applied Scanning Probe Methods II, edited by, B. Bhushan, and, H. Fuchs, (Springer, New York, 2006), pp. 39-70.
    • (2006) Applied Scanning Probe Methods II , pp. 39-70
    • Rabe, U.1
  • 16
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    • Cambridge University Press, Cambridge
    • K. L. Johnson, Contact Mechanics (Cambridge University Press, Cambridge, 1985), pp. 91-95.
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    • Johnson, K.L.1
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    • J. A. Turner and J. S. Wiehn, Nanotechnology 0957-4484 10.1088/0957-4484/12/3/321 12, 322 (2001).
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    • Turner, J.A.1    Wiehn, J.S.2
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    • edited by W. P.Mason and R. N.Thurston (Academic, San Diego
    • E. P. Papadakis, in Physical Acoustics, edited by, W. P. Mason, and, R. N. Thurston, (Academic, San Diego, 1976), Vol. 12, p. 277.
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    • Stan, G.1    Price, W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.