Atomic force acoustic microscopy characterization of nanostructured selenium-tin thin films

Superlattices and Microstructures

Volumn 44, Issue 4-5, 2008, Pages 641-649

  Passeri, D ^a   Rossi, M ^a   Alippi, A ^a   Bettucci, A ^a   Manno, D ^b   Serra, A ^b   Filippo, E ^b   Lucci, M ^c   Davoli, I ^c  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

^b UNIVERSITY OF SALENTO   (Italy)

^c UNIVERSITY OF ROME TOR VERGATA   (Italy)

Author keywords

Atomic force acoustic microscopy; Elastic properties imaging; Indentation modulus measurement

Indexed keywords

ACOUSTIC MICROSCOPES; ACOUSTIC VARIABLES MEASUREMENT; ACOUSTICS; ATOMIC PHYSICS; ATOMS; HIGH RESOLUTION ELECTRON MICROSCOPY; MICROSCOPIC EXAMINATION; OXIDE MINERALS; QUARTZ; SELENIUM; SEMICONDUCTING SELENIUM COMPOUNDS; THERMAL EVAPORATION; THICK FILMS; TIN; TITANIUM COMPOUNDS; ULTRATHIN FILMS;

ATOMIC FORCE; ATOMIC FORCE ACOUSTIC MICROSCOPY; ELASTIC PROPERTIES IMAGING; FILM SURFACES; FUSED QUARTZ; HIGH RESOLUTIONS; INDENTATION MODULUS MEASUREMENT; LOCAL ELASTIC PROPERTIES; NANO-STRUCTURED; POLY-CRYSTALLINE; TIN SELENIDE; TIN THIN FILMS; TRANSMISSION ELECTRON;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 53749102966     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2007.10.004     Document Type: Article

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