Mechanical testing of isolated amorphous silicon slanted nanorods

Journal of Nanoscience and Nanotechnology

Volumn 5, Issue 11, 2005, Pages 1893-1897

  Gaire, G ^a   Ye, D X ^a   Tang, F ^a   Picu, R C ^b   Wang, G C ^a   Lu, T M ^a  

^a Department of Physics Applied Physics and Astronomy   (United States)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

Amorphous Si; Atomic force microscope; Oblique angle deposition; Young's modulus

Indexed keywords

NANO-PILLARS; NANORODS; OBLIQUE ANGLE DEPOSITION; RECTANGULAR CROSS SECTIONS;

AMORPHOUS SILICON; ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; MECHANICAL TESTING; PARAMETER ESTIMATION; PHYSICAL VAPOR DEPOSITION;

NANOSTRUCTURED MATERIALS;

NANOMATERIAL; SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; BIOMECHANICS; CHEMISTRY; COMPRESSIVE STRENGTH; GAS; HARDNESS; MATERIALS TESTING; MECHANICAL STRESS; MECHANICS; METHODOLOGY; NANOTECHNOLOGY; REPRODUCIBILITY; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; TENSILE STRENGTH;

BIOMECHANICS; COMPRESSIVE STRENGTH; GASES; HARDNESS; MATERIALS TESTING; MECHANICS; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; NANOSTRUCTURES; NANOTECHNOLOGY; REPRODUCIBILITY OF RESULTS; RESEARCH DESIGN; SILICON; STRESS, MECHANICAL; SURFACE PROPERTIES; TENSILE STRENGTH;

EID: 33646164673     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2005.425     Document Type: Article

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