Quantitative evaluation of elastic properties of nano-crystalline nickel using atomic force acoustic microscopy

Zeitschrift fur Physikalische Chemie

Volumn 222, Issue 2-3, 2008, Pages 471-498

  Kopycinska Muller M ^a,b   Caron, A ^a,c   Hirsekorn, S ^a   Rabe, U ^a   Natter, H ^a   Hempelmann, R ^a   Birringer, R ^a   Arnold, W ^a  

^a SAARLAND UNIVERSITY   (Germany)

^b DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^c UNIVERSITY OF ULM   (Germany)

Author keywords

Atomic force acoustic microscopy; Contact mechanics; Indentation modulus; Nanocrystalline nickel; Nanoindentation

Indexed keywords

ACOUSTIC MICROSCOPES; ACOUSTIC VARIABLES MEASUREMENT; ATOMIC FORCE MICROSCOPY; BACKSCATTERING; DEFORMATION; ELASTICITY; GRAIN SIZE AND SHAPE; INDENTATION; NANOCANTILEVERS; NANOCRYSTALS; NANOINDENTATION; NICKEL; TEXTURES; ULTRASONIC VELOCITY MEASUREMENT;

ATOMIC FORCE ACOUSTIC MICROSCOPY; CONTACT MECHANICS; ELASTIC PROPERTIES; INDENTATION MODULUS; LOCAL ELASTIC PROPERTIES; NANO-CRYSTALLINE NICKEL; QUANTITATIVE EVALUATION; VIBRATION BEHAVIOR;

NICKEL METALLOGRAPHY;

EID: 39649109225     PISSN: 09429352     EISSN: None     Source Type: Journal    
DOI: 10.1524/zpch.2008.222.2-3.471     Document Type: Article

References (51)

1. V. B. Elings and J. A. Gurley, US Patent No. 5 266 801 (1993).
2. P. Maivald, H. J. Butt, S. A. C. Gould, C. B. Prater, B. Drake, J. A. Gurley, V. B. Elings, and P. K. Hansma, Nanotechnology 2 (1991) 103.
3. U. Rabe, K. Janser, and W Arnold, Rev. Sci. Instrum. 67 (1996) 3281.
4. K. Yamanaka, A. Noguchi, T. Tsuji, T. Koike, and T. Goto, Surf. Interf. Anal. 27 (1999) 600.
5. U. Rabe, Atomic Force Acoustic Microscopy. In: B. Bushan and H. Fuchs (Eds.), Applied Scanning Probe Methods, Vol. II, Springer, Heidelberg, Germany (2006) pp. 37-90.
6. K. L. Johnson, Contact Mechanics. Cambridge University Press, Cambridge, Great Britain (1985).
7. W. C. Oliver and G. M. Pharr, J. Mater. Res. 7 (1992) 613.
8. G. Kopycinska-Müller, R. H. Geiss, and D. C. Hurley, Ultramicroscopy 106 (2006) 466.
9. See e.g. www.ntmdt.ru: Calibration gratings TGT1 and TGG1 made by NT-MDT Co., Zelenograd, Russia.
10. S. Amelio, A. V. Goldade, U. Rabe, V. Scherer, B. Bhushan, and W. Arnold, Thin Solid Films 392 (2001) 75.
11. D. Passeri, A. Bettucci, M. Germano, M. Rossi, and A. Alippi, Rev. Sci. Instrum. 76 (2005) 93 904.
12. U. Rabe, S. Amelio, M. Kopycinska, S. Hirsekorn, M. Kempf, M. Göken, and W Arnold, Surf. Interf. Anal 33 (2002) 65.
13. M. Kopycinska-Müller, On the elastic properties of nanocrystalline materials and the determination of elastic properties on a nanoscale using the atomic force acoustic microscopy technique. PhD thesis, Science and Technical Faculty III, Saarland University and IZFP report No. 050116-TW (2005).
14. P. M. Morse and K. U. Ingard, Theoretical Acoustics. McGraw-Hill, New York (1968).
15. W. F. Stokey, Shock and Vibration Handbook. C. M. Harris and C. E. Crede (Eds.), McGraw-Hill, New York (1976).
16. U. Rabe, J. Turner, and W. Arnold, Appl. Phys. A 66 (1998) S277.
17. T. J. Senden and W. A. Ducker, Langmuir 10 (1994) 103.
18. N. A. Burnham, X. Chen, C. S. Hodges, G. A. Matei, E. J. Thoreson, C. J. Roberts, M. C. Davies, and S. J. B. Tendler, Nanotechnology 14 (2003) 1.
19. P. E. Mazeran and J. L. Loubet, Tribol. Lett. 3 (1997) 125.
20. G. Stan and W. Price, Rev. Sci. Instrum. 77 (2006) 103 707.
21. U. Rabe, E. Kester, and W. Arnold, Surf. Interf. Anal 27 (1999) 386.
22. M. Muraoka and W. Arnold, JSME Int. J. A 44 (2001) 396.
23. K. Yamanaka, Y. Maryama, T. Tsuji, and K. Nakomoto, Appl. Phys. Lett. 78 (2001) 1939.
24. th Int. Symp. Acoustical Imaging, W. Arnold and S. Hirsekorn (Eds.), Kluwer Academic Publishers (2004) p. 729.
25. I. N. Sneddon, Int. J. Eng. Sci. 3 (1965) 47.
26. J. J. Vlassak and W. D. Nix, Philos. Mag. A 67 (1993) 1045.
27. U. Rabe, M. Kopycinska, S. Hirsekorn, J. Munoz Saldana, G. A. Schneider, and W. Arnold, J. Phys. D 35 (2002) 2621.
28. G. Simmons and H. Wang, Single Crystal Elastic Constants and Calculated Aggregate Properties: A Handbook. The MIT Press, Cambridge, Mass. USA (1971).
29. www.minerals.sk.ca/atm_design/zerodur.html.
30. H. Natter, M. Schmelzer, and R. Hempelmann, J. Mater. Res. 13 (1998) 1186.
31. H. Natter and R. Hempelmann, Electrochim. Acta 49 (2003) 51.
32. H. P. Klug and L. E. Alexander, X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials. John Wiley & Sons, New York (1974).
33. H. Natter, M. Schmelzer, M.-S. Löffler, C E. Krill, A. Fitch, and R. Hempelmann, J. Phys. Chem. B 104 (2000) 2467.
34. V. Krstic, U. Erb, and G. Palumbo, Scr. Metall. Mater. 29 (1993) 1501.
35. G. Grimvall, Thermophysical Properties of Materials. Elsevier, Amsterdam, The Netherlands (1999).
36. B. Yang, Grain Size Effects on the Mechanical Behaviour of Polycrystalline Nickel from Micro to Nanoscale. PhD thesis, Science and Technical Faculty III, Saarland University, 2006, Shaker Verlag, ISBN 978-3-8322-5833-7 (2007).
37. B. Yang, H. Vehoff, and A. Barnoush, see paper in this volume.
38. A. Lapatie and D. Farkas, Scripta Mater. 48 (2003) 611.
39. S. J. Zhao, K. Albe, and H. Hahn, Scripta Mater. 55 (2006) 473.
40. A. Caron, PhD thesis, Science and Technical Faculty III, Saarland University (2007) in preparation.
41. J. Weissmuller, W. Krauss, T. Haubold, R. Birringer, and H. Gleiter, Nanostruct. Mater. 1 (1992) 439.
42. R. Glocker, Materialprüfung mit Röntgenstrahlung. Springer, Berlin (1985).
43. B. Bhushan, Diam. Relat. Mater. 8 (1999) 1985;
44. X. Li and B. Bhushan, J. Mater. Res. 14 (1999) 2328.
45. D. Schneider, T. Schwarz, H. J. Scheibe, and M. Panzner, Thin Solid Films 295 (1997) 107.
46. J. A. Turner, S. Hirsekorn, U. Rabe, and W Arnold, J. Appl. Phys. 82 (1997) 966.
47. G. Kopycinska-Müller, R. H. Geiss, J. Müller, and D. C. Hurley, Nanotechnology 16 (2005) 703.
48. K. Fujiwara, H. Tanimoto, and M. Mizubayashi, Mater. Sci. Eng. A 442 (2006) 336.
49. Y. Zhou, U. Erb, K. T. Aust, and G. Palumbo, Z. Metallk. 94 (2003) 10.
50. T. D. Shen, C. C. Koch, T. Y. Tsui, and G. M. Pharr, J. Mater. Res. 6 (1991) 1012.
51. J. Tian, H. Ogi, and M. Hirao, Appl. Phys. Lett. 87 (2005) 204 107.