-
1
-
-
75649141765
-
Ultralow-ower design in near-threshold region
-
Feb
-
D. Markovic, C. C. Wang, L. P. Alarcon, T.-T. Liu, and J. M. Rabaey, "Ultralow-ower design in near-threshold region," Proc. IEEE, vol. 98, no. 2, pp. 237-252, Feb. 2010.
-
(2010)
Proc. IEEE
, vol.98
, Issue.2
, pp. 237-252
-
-
Markovic, D.1
Wang, C.C.2
Alarcon, L.P.3
Liu, T.-T.4
Rabaey, J.M.5
-
2
-
-
25144514874
-
Modeling and sizing for minimum energy operation in subthreshold circuits
-
Sep
-
B. H. Calhoun, A. Wang, and A. Chandrakasan, "Modeling and sizing for minimum energy operation in subthreshold circuits," IEEE J. Solid-State Circuits, vol. 40, no. 9, pp. 1778-1786, Sep. 2005.
-
(2005)
IEEE J. Solid-State Circuits
, vol.40
, Issue.9
, pp. 1778-1786
-
-
Calhoun, B.H.1
Wang, A.2
Chandrakasan, A.3
-
3
-
-
50849094177
-
Highperformance SRAM in nanoscale CMOS: Design challenges and techniques
-
Design Testing, Dec. 3-5
-
C. T. Chuang, S. Mukhopadhyay, J.-J. Kim, K. Kim, and R. Rao, "Highperformance SRAM in nanoscale CMOS: Design challenges and techniques," in Proc. IEEE Int. Workshop Memory Technol., Design Testing, Dec. 3-5, 2007, pp. 4-12.
-
(2007)
Proc. IEEE Int. Workshop Memory Technol.
, pp. 4-12
-
-
Chuang, C.T.1
Mukhopadhyay, S.2
Kim, J.-J.3
Kim, K.4
Rao, R.5
-
4
-
-
79551573138
-
A 130 mV SRAM with expanded write and read margins for subthreshold applications
-
Feb
-
M. F. Chang, S.-W. Chang, P.-W. Chou, and W.-C. Wu, "A 130 mV SRAM with expanded write and read margins for subthreshold applications," IEEE J. Solid-State Circuits, vol. 46, no. 2, pp. 520-529, Feb. 2011.
-
(2011)
IEEE J. Solid-State Circuits
, vol.46
, Issue.2
, pp. 520-529
-
-
Chang, M.F.1
Chang, S.-W.2
Chou, P.-W.3
Wu, W.-C.4
-
5
-
-
67649651691
-
A voltage scalable 0.26 V, 64 kb 8T SRAM with Vmin lowering techniques and deep sleep mode
-
Jun.
-
T. H. Kim, J. Liu, and C. H. Kim, "A voltage scalable 0.26 V, 64 kb 8T SRAM with Vmin lowering techniques and deep sleep mode," IEEE J. Solid-State Circuits, vol. 44, no. 6, pp. 1785-1795, Jun. 2009.
-
(2009)
IEEE J. Solid-State Circuits
, vol.44
, Issue.6
, pp. 1785-1795
-
-
Kim, T.H.1
Liu, J.2
Kim, C.H.3
-
6
-
-
41549129905
-
An 8T-SRAM for variability tolerance and low-voltage operation in highperformance caches
-
Apr
-
L. Chang, R. K. Montoye, Y. Nakamura, K. A. Batson, R. J. Eickemeyer, R. H. Dennard, W. Haensch, and D. Jamsek, "An 8T-SRAM for variability tolerance and low-voltage operation in highperformance caches," IEEE J. Solid-State Circuits, vol. 43, no. 4, pp. 956-963, Apr. 2008.
-
(2008)
IEEE J. Solid-State Circuits
, vol.43
, Issue.4
, pp. 956-963
-
-
Chang, L.1
Montoye, R.K.2
Nakamura, Y.3
Batson, K.A.4
Eickemeyer, R.J.5
Dennard, R.H.6
Haensch, W.7
Jamsek, D.8
-
7
-
-
78650885828
-
A 512 kb 8T SRAM macro operating down to 0.57 v with an AC-coupled sense amplifier and embedded data-retention-voltage sensor in 45 nm SOI CMOS
-
Jan
-
M. Qazi, K. Stawiasz, L. Chang, and A. P. Chandrakasan, "A 512 kb 8T SRAM macro operating down to 0.57 V with an AC-coupled sense amplifier and embedded data-retention-voltage sensor in 45 nm SOI CMOS," IEEE J. Solid-State Circuits, vol. 46, no. 1, pp. 85-96, Jan. 2011.
-
(2011)
IEEE J. Solid-State Circuits
, vol.46
, Issue.1
, pp. 85-96
-
-
Qazi, M.1
Stawiasz, K.2
Chang, L.3
Chandrakasan, A.P.4
-
8
-
-
52249106671
-
A stable 2-ort SRAM cell design against simultaneously read/writedisturbed accesses
-
Sep
-
T. Suzuki, H. Yamauchi, Y. Yamagami, K. Satomi, and H. Akamatsu, "A stable 2-ort SRAM cell design against simultaneously read/writedisturbed accesses," IEEE J. Solid-State Circuits, vol. 43, no. 9, pp. 2109- 2119, Sep. 2008.
-
(2008)
IEEE J. Solid-State Circuits
, vol.43
, Issue.9
, pp. 2109-2119
-
-
Suzuki, T.1
Yamauchi, H.2
Yamagami, Y.3
Satomi, K.4
Akamatsu, H.5
-
9
-
-
85008054031
-
A 256 kb 65 nm 8T subthreshold SRAM employing sense-amplifier redundancy
-
Jan
-
N. Verma and A. P. Chandrakasan, "A 256 kb 65 nm 8T subthreshold SRAM employing sense-amplifier redundancy," IEEE J. Solid-State Circuits, vol. 43, no. 1, pp. 141-149, Jan. 2008.
-
(2008)
IEEE J. Solid-State Circuits
, vol.43
, Issue.1
, pp. 141-149
-
-
Verma, N.1
Chandrakasan, A.P.2
-
10
-
-
70449473258
-
A reconfigurable 8T Ultra-Dynamic Voltage Scalable (U-DVS) SRAM in 65 nm CMOS
-
Nov
-
M. E. Sinangil, N. Verma, and A. P. Chandrakasan, "A reconfigurable 8T Ultra-Dynamic Voltage Scalable (U-DVS) SRAM in 65 nm CMOS," IEEE J. Solid-State Circuits, vol. 44, no. 11, pp. 3163-3173, Nov. 2009.
-
(2009)
IEEE J. Solid-State Circuits
, vol.44
, Issue.11
, pp. 3163-3173
-
-
Sinangil, M.E.1
Verma, N.2
Chandrakasan, A.P.3
-
11
-
-
33847724635
-
A 256-kb 65-nm sub-threshold SRAM design for ultra-low-voltage operation
-
Mar
-
B. H. Calhoun and A. Chandrakasan, "A 256-kb 65-nm sub-threshold SRAM design for ultra-low-voltage operation," IEEE J. Solid-State Circuits, vol. 42, no. 3, pp. 680-688, Mar. 2007.
-
(2007)
IEEE J. Solid-State Circuits
, vol.42
, Issue.3
, pp. 680-688
-
-
Calhoun, B.H.1
Chandrakasan, A.2
-
12
-
-
38849084539
-
A 0.2 V, 480 kb subthreshold SRAM with 1 k cells per bitline for ultra-low-voltage computing
-
Feb
-
T. H. Kim, J. Liu, J. Keane, and C. H. Kim, "A 0.2 V, 480 kb subthreshold SRAM with 1 k cells per bitline for ultra-low-voltage computing," IEEE J. Solid-State Circuits, vol. 43, no. 2, pp. 518-529, Feb. 2008.
-
(2008)
IEEE J. Solid-State Circuits
, vol.43
, Issue.2
, pp. 518-529
-
-
Kim, T.H.1
Liu, J.2
Keane, J.3
Kim, C.H.4
-
13
-
-
41549118603
-
Characterization of a novel nine-transistor SRAM cell
-
Apr
-
Z. Liu and V. Kursun, "Characterization of a novel nine-transistor SRAM cell," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 16, no. 4, pp. 488-492, Apr. 2008.
-
(2008)
IEEE Trans. Very Large Scale Integr. (VLSI) Syst.
, vol.16
, Issue.4
, pp. 488-492
-
-
Liu, Z.1
Kursun, V.2
-
14
-
-
79953214888
-
A large σvTH/VDD tolerant zigzag 8T SRAM with area-efficient decoupled differential sensing and fast write-back scheme
-
Apr.
-
J. J. Wu, Y.-H. Chen, M.-F. Chang, P.-W. Chou, C.-Y. Chen, H.-J. Liao, M.-B. Chen, Y.-H. Chu, W.-C. Wu, and H. Yamauchi, "A large σVTH/VDD tolerant zigzag 8T SRAM with area-efficient decoupled differential sensing and fast write-back scheme," IEEE J. Solid-State Circuits, vol. 46, no. 4, pp. 815-827, Apr. 2011.
-
(2011)
IEEE J. Solid-State Circuits
, vol.46
, Issue.4
, pp. 815-827
-
-
Wu, J.J.1
Chen, Y.-H.2
Chang, M.-F.3
Chou, P.-W.4
Chen, C.-Y.5
Liao, H.-J.6
Chen, M.-B.7
Chu, Y.-H.8
Wu, W.-C.9
Yamauchi, H.10
-
15
-
-
79960984427
-
A read-disturb-free, differential sensing 1R/1W port, 8T Bitcell array
-
Sep.
-
J. P. Kulkarni, A. Goel, P. Ndai, and K. Roy, "A read-disturb-free, differential sensing 1R/1W port, 8T Bitcell array," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 19, no. 9, pp. 1727-1730, Sep. 2011.
-
(2011)
IEEE Trans. Very Large Scale Integr. (VLSI) Syst.
, vol.19
, Issue.9
, pp. 1727-1730
-
-
Kulkarni, J.P.1
Goel, A.2
Ndai, P.3
Roy, K.4
-
16
-
-
78650305296
-
Singleended subthreshold SRAM with asymmetrical write/read-assist
-
Dec.
-
M. H. Tu, J.-Y. Lin, M.-C. Tsai, S.-J. Jou, and C.-T. Chuang, "Singleended subthreshold SRAM with asymmetrical write/read-assist," IEEE Trans. Circuits Syst. I, Reg. Papers, vol. 57, no. 12, pp. 3039-3047, Dec. 2010.
-
(2010)
IEEE Trans. Circuits Syst. I, Reg. Papers
, vol.57
, Issue.12
, pp. 3039-3047
-
-
Tu, M.H.1
Lin, J.-Y.2
Tsai, M.-C.3
Jou, S.-J.4
Chuang, C.-T.5
-
17
-
-
70449440865
-
A 45 nm 0.6 v cross-oint 8T SRAM with negative biased read/write assist
-
Jun. 16-18
-
M. Yabuuchi, K. Nii, Y. Tsukamoto, S. Ohbayashi, and Y. Nakase, "A 45 nm 0.6 V cross-oint 8T SRAM with negative biased read/write assist," in Proc. VLSI Symp. Circuits, Jun. 16-18, 2009, pp. 158-159.
-
(2009)
Proc. VLSI Symp. Circuits
, pp. 158-159
-
-
Yabuuchi, M.1
Nii, K.2
Tsukamoto, Y.3
Ohbayashi, S.4
Nakase, Y.5
-
18
-
-
79955565368
-
A novel column-decoupled 8T cell for low-ower differential and domino-based SRAM design
-
May
-
R. V. Joshi, R. Kanj, and V. Ramudurai, "A novel column-decoupled 8T cell for low-ower differential and domino-based SRAM design," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 19, no. 5, pp. 869-882, May 2011.
-
(2011)
IEEE Trans. Very Large Scale Integr. (VLSI) Syst.
, vol.19
, Issue.5
, pp. 869-882
-
-
Joshi, R.V.1
Kanj, R.2
Ramudurai, V.3
-
19
-
-
84861719440
-
A single-ended disturb-free 9T subthreshold SRAM with cross-oint dataaware write word-line structure, negative bit-line, and adaptive read operation timing tracing
-
Jun.
-
M. H. Tu, J.-Y. Lin, M.-C. Tsai, C.-Y. Lu, Y.-J. Lin, M.-H. Wang, H.-S. Huang, K.-D. Lee, W.-C. Shih, S.-J. Jou, and C.-T. Chuang, "A single-ended disturb-free 9T subthreshold SRAM with cross-oint dataaware write word-line structure, negative bit-line, and adaptive read operation timing tracing," IEEE J. Solid-State Circuits, vol. 47, no. 6, pp. 1469-1482, Jun. 2012.
-
(2012)
IEEE J. Solid-State Circuits
, vol.47
, Issue.6
, pp. 1469-1482
-
-
Tu, M.H.1
Lin, J.-Y.2
Tsai, M.-C.3
Lu, C.-Y.4
Lin, Y.-J.5
Wang, M.-H.6
Huang, H.-S.7
Lee, K.-D.8
Shih, W.-C.9
Jou, S.-J.10
Chuang, C.-T.11
-
20
-
-
59349118349
-
A 32 kb 10T sub-threshold SRAM array with bit-interleaving and differential read scheme in 90 nm CMOS
-
Feb
-
I. J. Chang, J.-J. Kim, S. P. Park, and K. Roy, "A 32 kb 10T sub-threshold SRAM array with bit-interleaving and differential read scheme in 90 nm CMOS," IEEE J. Solid-State Circuits, vol. 44, no. 2, pp. 650-658, Feb. 2009.
-
(2009)
IEEE J. Solid-State Circuits
, vol.44
, Issue.2
, pp. 650-658
-
-
Chang, I.J.1
Kim, J.-J.2
Park, S.P.3
Roy, K.4
-
21
-
-
80255136207
-
A 250 mV 8 kb 40 nm ultra-low power 9T supply feedback SRAM (SF-SRAM)
-
Nov
-
A. Teman, L. Pergament, O. Cohen, and A. Fish, "A 250 mV 8 kb 40 nm ultra-low power 9T supply feedback SRAM (SF-SRAM)," IEEE J. Solid-State Circuits, vol. 46, no. 11, pp. 2713-2726, Nov. 2011.
-
(2011)
IEEE J. Solid-State Circuits
, vol.46
, Issue.11
, pp. 2713-2726
-
-
Teman, A.1
Pergament, L.2
Cohen, O.3
Fish, A.4
-
22
-
-
79952072363
-
P-P-N based 10T SRAM cell for lowleakage and resilient subthreshold operation
-
Mar
-
C. H. Lo and S.-Y. Huang, "P-P-N based 10T SRAM cell for lowleakage and resilient subthreshold operation," IEEE J. Solid-State Circuits, vol. 46, no. 3, pp. 695-704, Mar. 2011.
-
(2011)
IEEE J. Solid-State Circuits
, vol.46
, Issue.3
, pp. 695-704
-
-
Lo, C.H.1
Huang, S.-Y.2
-
23
-
-
77957893965
-
Alphaparticle- induced soft errors and multiple cell upsets in 65-nm 10T subthreshold SRAM
-
May 2-6
-
H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Alphaparticle- induced soft errors and multiple cell upsets in 65-nm 10T subthreshold SRAM," in Proc. IEEE Int. Rel. Phys. Symp., May 2-6, 2010, pp. 213-217.
-
(2010)
Proc. IEEE Int. Rel. Phys. Symp.
, pp. 213-217
-
-
Fuketa, H.1
Hashimoto, M.2
Mitsuyama, Y.3
Onoye, T.4
-
24
-
-
69549118775
-
SRAM interleaving distance selection with a soft error failure model
-
Aug
-
S. Baeg, S. J. Wen, and R. Wong, "SRAM interleaving distance selection with a soft error failure model," IEEE Trans. Nucl. Sci., vol. 56, no. 4, pp. 2111-2118, Aug. 2009.
-
(2009)
IEEE Trans. Nucl. Sci.
, vol.56
, Issue.4
, pp. 2111-2118
-
-
Baeg, S.1
Wen, S.J.2
Wong, R.3
-
25
-
-
41549094625
-
A high-speed variation-tolerant interconnect technique for sub-threshold circuits using capacitive boosting
-
Apr
-
J. Kil, J. Gu, and C. H. Kim, "A high-speed variation-tolerant interconnect technique for sub-threshold circuits using capacitive boosting," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 16, no. 4, pp. 456-465, Apr. 2008.
-
(2008)
IEEE Trans. Very Large Scale Integr. (VLSI) Syst.
, vol.16
, Issue.4
, pp. 456-465
-
-
Kil, J.1
Gu, J.2
Kim, C.H.3
-
26
-
-
62749197560
-
Improving power-delay performance of ultra-low-ower subthreshold SCL circuits
-
Feb
-
A. Tajalli, M. Alioto, and Y. Leblebici, "Improving power-delay performance of ultra-low-ower subthreshold SCL circuits," IEEE Trans. Circuits Syst. II, Exp. Briefs, vol. 56, no. 2, pp. 127-131, Feb. 2009.
-
(2009)
IEEE Trans. Circuits Syst. II, Exp. Briefs
, vol.56
, Issue.2
, pp. 127-131
-
-
Tajalli, A.1
Alioto, M.2
Leblebici, Y.3
-
27
-
-
84855652495
-
Ultra-low power VLSI circuit design demystified and explained: A tutorial
-
Jan
-
M. Alioto, "Ultra-low power VLSI circuit design demystified and explained: A tutorial," IEEE Trans. Circuits Syst. I, Reg. Papers, vol. 59, no. 1, pp. 3-29, Jan. 2012.
-
(2012)
IEEE Trans. Circuits Syst. I, Reg. Papers
, vol.59
, Issue.1
, pp. 3-29
-
-
Alioto, M.1
-
28
-
-
51949112103
-
A 0.7 v single-supply SRAM with 0.495 um2 cell in 65 nm technology utilizing self-write-back sense amplifier and cascaded bit line scheme
-
K. Kushida, A. Suzuki, G. Fukano, A. Kawasumi, O. Hirabayashi, Y. Takeyama, T. Sasaki, A. Katayama, Y. Fujimura, and T. Yabe, "A 0.7 V single-supply SRAM with 0.495 um2 cell in 65 nm technology utilizing self-write-back sense amplifier and cascaded bit line scheme," in Proc. IEEE VLSI Symp. Circuits, 2008, pp. 46-47.
-
(2008)
Proc. IEEE VLSI Symp. Circuits
, pp. 46-47
-
-
Kushida, K.1
Suzuki, A.2
Fukano, G.3
Kawasumi, A.4
Hirabayashi, O.5
Takeyama, Y.6
Sasaki, T.7
Katayama, A.8
Fujimura, Y.9
Yabe, T.10
|