메뉴 건너뛰기




Volumn 59, Issue 12, 2012, Pages 863-867

A 0.33-V, 500-kHz, 3.94-μW 40-nm 72-Kb 9T subthreshold SRAM with ripple bit-line structure and negative bit-line write-assist

Author keywords

9T SRAM cell; Negative bit line (NBL); ripple bit line (RPBL); subthreshold static random access memory (SRAM); ultra low voltage

Indexed keywords

ELECTRIC POWER UTILIZATION; ENERGY EFFICIENCY;

EID: 84873375583     PISSN: 15497747     EISSN: 15583791     Source Type: Journal    
DOI: 10.1109/TCSII.2012.2231017     Document Type: Article
Times cited : (15)

References (28)
  • 1
    • 75649141765 scopus 로고    scopus 로고
    • Ultralow-ower design in near-threshold region
    • Feb
    • D. Markovic, C. C. Wang, L. P. Alarcon, T.-T. Liu, and J. M. Rabaey, "Ultralow-ower design in near-threshold region," Proc. IEEE, vol. 98, no. 2, pp. 237-252, Feb. 2010.
    • (2010) Proc. IEEE , vol.98 , Issue.2 , pp. 237-252
    • Markovic, D.1    Wang, C.C.2    Alarcon, L.P.3    Liu, T.-T.4    Rabaey, J.M.5
  • 2
    • 25144514874 scopus 로고    scopus 로고
    • Modeling and sizing for minimum energy operation in subthreshold circuits
    • Sep
    • B. H. Calhoun, A. Wang, and A. Chandrakasan, "Modeling and sizing for minimum energy operation in subthreshold circuits," IEEE J. Solid-State Circuits, vol. 40, no. 9, pp. 1778-1786, Sep. 2005.
    • (2005) IEEE J. Solid-State Circuits , vol.40 , Issue.9 , pp. 1778-1786
    • Calhoun, B.H.1    Wang, A.2    Chandrakasan, A.3
  • 4
    • 79551573138 scopus 로고    scopus 로고
    • A 130 mV SRAM with expanded write and read margins for subthreshold applications
    • Feb
    • M. F. Chang, S.-W. Chang, P.-W. Chou, and W.-C. Wu, "A 130 mV SRAM with expanded write and read margins for subthreshold applications," IEEE J. Solid-State Circuits, vol. 46, no. 2, pp. 520-529, Feb. 2011.
    • (2011) IEEE J. Solid-State Circuits , vol.46 , Issue.2 , pp. 520-529
    • Chang, M.F.1    Chang, S.-W.2    Chou, P.-W.3    Wu, W.-C.4
  • 5
    • 67649651691 scopus 로고    scopus 로고
    • A voltage scalable 0.26 V, 64 kb 8T SRAM with Vmin lowering techniques and deep sleep mode
    • Jun.
    • T. H. Kim, J. Liu, and C. H. Kim, "A voltage scalable 0.26 V, 64 kb 8T SRAM with Vmin lowering techniques and deep sleep mode," IEEE J. Solid-State Circuits, vol. 44, no. 6, pp. 1785-1795, Jun. 2009.
    • (2009) IEEE J. Solid-State Circuits , vol.44 , Issue.6 , pp. 1785-1795
    • Kim, T.H.1    Liu, J.2    Kim, C.H.3
  • 7
    • 78650885828 scopus 로고    scopus 로고
    • A 512 kb 8T SRAM macro operating down to 0.57 v with an AC-coupled sense amplifier and embedded data-retention-voltage sensor in 45 nm SOI CMOS
    • Jan
    • M. Qazi, K. Stawiasz, L. Chang, and A. P. Chandrakasan, "A 512 kb 8T SRAM macro operating down to 0.57 V with an AC-coupled sense amplifier and embedded data-retention-voltage sensor in 45 nm SOI CMOS," IEEE J. Solid-State Circuits, vol. 46, no. 1, pp. 85-96, Jan. 2011.
    • (2011) IEEE J. Solid-State Circuits , vol.46 , Issue.1 , pp. 85-96
    • Qazi, M.1    Stawiasz, K.2    Chang, L.3    Chandrakasan, A.P.4
  • 8
    • 52249106671 scopus 로고    scopus 로고
    • A stable 2-ort SRAM cell design against simultaneously read/writedisturbed accesses
    • Sep
    • T. Suzuki, H. Yamauchi, Y. Yamagami, K. Satomi, and H. Akamatsu, "A stable 2-ort SRAM cell design against simultaneously read/writedisturbed accesses," IEEE J. Solid-State Circuits, vol. 43, no. 9, pp. 2109- 2119, Sep. 2008.
    • (2008) IEEE J. Solid-State Circuits , vol.43 , Issue.9 , pp. 2109-2119
    • Suzuki, T.1    Yamauchi, H.2    Yamagami, Y.3    Satomi, K.4    Akamatsu, H.5
  • 9
    • 85008054031 scopus 로고    scopus 로고
    • A 256 kb 65 nm 8T subthreshold SRAM employing sense-amplifier redundancy
    • Jan
    • N. Verma and A. P. Chandrakasan, "A 256 kb 65 nm 8T subthreshold SRAM employing sense-amplifier redundancy," IEEE J. Solid-State Circuits, vol. 43, no. 1, pp. 141-149, Jan. 2008.
    • (2008) IEEE J. Solid-State Circuits , vol.43 , Issue.1 , pp. 141-149
    • Verma, N.1    Chandrakasan, A.P.2
  • 10
    • 70449473258 scopus 로고    scopus 로고
    • A reconfigurable 8T Ultra-Dynamic Voltage Scalable (U-DVS) SRAM in 65 nm CMOS
    • Nov
    • M. E. Sinangil, N. Verma, and A. P. Chandrakasan, "A reconfigurable 8T Ultra-Dynamic Voltage Scalable (U-DVS) SRAM in 65 nm CMOS," IEEE J. Solid-State Circuits, vol. 44, no. 11, pp. 3163-3173, Nov. 2009.
    • (2009) IEEE J. Solid-State Circuits , vol.44 , Issue.11 , pp. 3163-3173
    • Sinangil, M.E.1    Verma, N.2    Chandrakasan, A.P.3
  • 11
    • 33847724635 scopus 로고    scopus 로고
    • A 256-kb 65-nm sub-threshold SRAM design for ultra-low-voltage operation
    • Mar
    • B. H. Calhoun and A. Chandrakasan, "A 256-kb 65-nm sub-threshold SRAM design for ultra-low-voltage operation," IEEE J. Solid-State Circuits, vol. 42, no. 3, pp. 680-688, Mar. 2007.
    • (2007) IEEE J. Solid-State Circuits , vol.42 , Issue.3 , pp. 680-688
    • Calhoun, B.H.1    Chandrakasan, A.2
  • 12
    • 38849084539 scopus 로고    scopus 로고
    • A 0.2 V, 480 kb subthreshold SRAM with 1 k cells per bitline for ultra-low-voltage computing
    • Feb
    • T. H. Kim, J. Liu, J. Keane, and C. H. Kim, "A 0.2 V, 480 kb subthreshold SRAM with 1 k cells per bitline for ultra-low-voltage computing," IEEE J. Solid-State Circuits, vol. 43, no. 2, pp. 518-529, Feb. 2008.
    • (2008) IEEE J. Solid-State Circuits , vol.43 , Issue.2 , pp. 518-529
    • Kim, T.H.1    Liu, J.2    Keane, J.3    Kim, C.H.4
  • 13
    • 41549118603 scopus 로고    scopus 로고
    • Characterization of a novel nine-transistor SRAM cell
    • Apr
    • Z. Liu and V. Kursun, "Characterization of a novel nine-transistor SRAM cell," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 16, no. 4, pp. 488-492, Apr. 2008.
    • (2008) IEEE Trans. Very Large Scale Integr. (VLSI) Syst. , vol.16 , Issue.4 , pp. 488-492
    • Liu, Z.1    Kursun, V.2
  • 15
    • 79960984427 scopus 로고    scopus 로고
    • A read-disturb-free, differential sensing 1R/1W port, 8T Bitcell array
    • Sep.
    • J. P. Kulkarni, A. Goel, P. Ndai, and K. Roy, "A read-disturb-free, differential sensing 1R/1W port, 8T Bitcell array," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 19, no. 9, pp. 1727-1730, Sep. 2011.
    • (2011) IEEE Trans. Very Large Scale Integr. (VLSI) Syst. , vol.19 , Issue.9 , pp. 1727-1730
    • Kulkarni, J.P.1    Goel, A.2    Ndai, P.3    Roy, K.4
  • 17
  • 18
    • 79955565368 scopus 로고    scopus 로고
    • A novel column-decoupled 8T cell for low-ower differential and domino-based SRAM design
    • May
    • R. V. Joshi, R. Kanj, and V. Ramudurai, "A novel column-decoupled 8T cell for low-ower differential and domino-based SRAM design," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 19, no. 5, pp. 869-882, May 2011.
    • (2011) IEEE Trans. Very Large Scale Integr. (VLSI) Syst. , vol.19 , Issue.5 , pp. 869-882
    • Joshi, R.V.1    Kanj, R.2    Ramudurai, V.3
  • 19
    • 84861719440 scopus 로고    scopus 로고
    • A single-ended disturb-free 9T subthreshold SRAM with cross-oint dataaware write word-line structure, negative bit-line, and adaptive read operation timing tracing
    • Jun.
    • M. H. Tu, J.-Y. Lin, M.-C. Tsai, C.-Y. Lu, Y.-J. Lin, M.-H. Wang, H.-S. Huang, K.-D. Lee, W.-C. Shih, S.-J. Jou, and C.-T. Chuang, "A single-ended disturb-free 9T subthreshold SRAM with cross-oint dataaware write word-line structure, negative bit-line, and adaptive read operation timing tracing," IEEE J. Solid-State Circuits, vol. 47, no. 6, pp. 1469-1482, Jun. 2012.
    • (2012) IEEE J. Solid-State Circuits , vol.47 , Issue.6 , pp. 1469-1482
    • Tu, M.H.1    Lin, J.-Y.2    Tsai, M.-C.3    Lu, C.-Y.4    Lin, Y.-J.5    Wang, M.-H.6    Huang, H.-S.7    Lee, K.-D.8    Shih, W.-C.9    Jou, S.-J.10    Chuang, C.-T.11
  • 20
    • 59349118349 scopus 로고    scopus 로고
    • A 32 kb 10T sub-threshold SRAM array with bit-interleaving and differential read scheme in 90 nm CMOS
    • Feb
    • I. J. Chang, J.-J. Kim, S. P. Park, and K. Roy, "A 32 kb 10T sub-threshold SRAM array with bit-interleaving and differential read scheme in 90 nm CMOS," IEEE J. Solid-State Circuits, vol. 44, no. 2, pp. 650-658, Feb. 2009.
    • (2009) IEEE J. Solid-State Circuits , vol.44 , Issue.2 , pp. 650-658
    • Chang, I.J.1    Kim, J.-J.2    Park, S.P.3    Roy, K.4
  • 21
    • 80255136207 scopus 로고    scopus 로고
    • A 250 mV 8 kb 40 nm ultra-low power 9T supply feedback SRAM (SF-SRAM)
    • Nov
    • A. Teman, L. Pergament, O. Cohen, and A. Fish, "A 250 mV 8 kb 40 nm ultra-low power 9T supply feedback SRAM (SF-SRAM)," IEEE J. Solid-State Circuits, vol. 46, no. 11, pp. 2713-2726, Nov. 2011.
    • (2011) IEEE J. Solid-State Circuits , vol.46 , Issue.11 , pp. 2713-2726
    • Teman, A.1    Pergament, L.2    Cohen, O.3    Fish, A.4
  • 22
    • 79952072363 scopus 로고    scopus 로고
    • P-P-N based 10T SRAM cell for lowleakage and resilient subthreshold operation
    • Mar
    • C. H. Lo and S.-Y. Huang, "P-P-N based 10T SRAM cell for lowleakage and resilient subthreshold operation," IEEE J. Solid-State Circuits, vol. 46, no. 3, pp. 695-704, Mar. 2011.
    • (2011) IEEE J. Solid-State Circuits , vol.46 , Issue.3 , pp. 695-704
    • Lo, C.H.1    Huang, S.-Y.2
  • 23
    • 77957893965 scopus 로고    scopus 로고
    • Alphaparticle- induced soft errors and multiple cell upsets in 65-nm 10T subthreshold SRAM
    • May 2-6
    • H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Alphaparticle- induced soft errors and multiple cell upsets in 65-nm 10T subthreshold SRAM," in Proc. IEEE Int. Rel. Phys. Symp., May 2-6, 2010, pp. 213-217.
    • (2010) Proc. IEEE Int. Rel. Phys. Symp. , pp. 213-217
    • Fuketa, H.1    Hashimoto, M.2    Mitsuyama, Y.3    Onoye, T.4
  • 24
    • 69549118775 scopus 로고    scopus 로고
    • SRAM interleaving distance selection with a soft error failure model
    • Aug
    • S. Baeg, S. J. Wen, and R. Wong, "SRAM interleaving distance selection with a soft error failure model," IEEE Trans. Nucl. Sci., vol. 56, no. 4, pp. 2111-2118, Aug. 2009.
    • (2009) IEEE Trans. Nucl. Sci. , vol.56 , Issue.4 , pp. 2111-2118
    • Baeg, S.1    Wen, S.J.2    Wong, R.3
  • 25
    • 41549094625 scopus 로고    scopus 로고
    • A high-speed variation-tolerant interconnect technique for sub-threshold circuits using capacitive boosting
    • Apr
    • J. Kil, J. Gu, and C. H. Kim, "A high-speed variation-tolerant interconnect technique for sub-threshold circuits using capacitive boosting," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 16, no. 4, pp. 456-465, Apr. 2008.
    • (2008) IEEE Trans. Very Large Scale Integr. (VLSI) Syst. , vol.16 , Issue.4 , pp. 456-465
    • Kil, J.1    Gu, J.2    Kim, C.H.3
  • 26
    • 62749197560 scopus 로고    scopus 로고
    • Improving power-delay performance of ultra-low-ower subthreshold SCL circuits
    • Feb
    • A. Tajalli, M. Alioto, and Y. Leblebici, "Improving power-delay performance of ultra-low-ower subthreshold SCL circuits," IEEE Trans. Circuits Syst. II, Exp. Briefs, vol. 56, no. 2, pp. 127-131, Feb. 2009.
    • (2009) IEEE Trans. Circuits Syst. II, Exp. Briefs , vol.56 , Issue.2 , pp. 127-131
    • Tajalli, A.1    Alioto, M.2    Leblebici, Y.3
  • 27
    • 84855652495 scopus 로고    scopus 로고
    • Ultra-low power VLSI circuit design demystified and explained: A tutorial
    • Jan
    • M. Alioto, "Ultra-low power VLSI circuit design demystified and explained: A tutorial," IEEE Trans. Circuits Syst. I, Reg. Papers, vol. 59, no. 1, pp. 3-29, Jan. 2012.
    • (2012) IEEE Trans. Circuits Syst. I, Reg. Papers , vol.59 , Issue.1 , pp. 3-29
    • Alioto, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.