Quasi-analytical model for scattering infrared near-field microscopy on layered systems

Optics Express

Volumn 20, Issue 12, 2012, Pages 13173-13188

  Hauer, Benedikt ^a   Engelhardt, Andreas P ^a   Taubner, Thomas ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL MODELS; CRYSTAL STRUCTURE;

DIELECTRIC CAPPING LAYERS; DIELECTRIC FUNCTIONS; EXPERIMENTAL DATA; LAYER THICKNESS; LAYERED SAMPLE; LAYERED SYSTEMS; MATERIAL COMPOSITIONS; MODEL PREDICTION; NANO SCALE; NEAR FIELD MICROSCOPY; NEAR-FIELD; POINT-DIPOLE APPROXIMATION; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SMALL VARIATIONS; TIP RADIUS; VIBRATION AMPLITUDE;

MODELS;

EID: 84863757646     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.013173     Document Type: Article

References (48)

1. G. Friedbacher and H. Bubert, eds., Surface and Thin Film Analysis, 2nd ed. (Wiley-VCH, Weinheim, 2011).
2. Y. Inouye and S. Kawata, "Near-field scanning optical microscopy with a metallic probe tip," Opt. Lett. 19, 159-161 (1994).
3. F. Zenhausern, Y. Martin, and H. K. Wickramasinghe, "Scanning interferometric apertureless microscopy: Optical imaging at 10 angstrom resolution," Science 269, 1083-1085 (1995).
4. H. Kuzmany, Solid State Spectroscopy, 2nd ed. (Springer, Berlin, Heidelberg, 2009), Chap. 10.
5. F. Keilmann and R. Hillenbrand, "Near-field nanoscopy by elastic light scattering from a tip," in A. Zayats and D. Richards, eds., Nano-optics and near-field optical microscopy (Artech House, Boston, London, 2009), Chap. 11, pp. 235-265.
6. M. Born and E. Wolf, Principles of Optics, 7th ed. (Cambridge University Press, 1999), Section 8.6.
7. T. Taubner, R. Hillenbrand, and F. Keilmann, "Performance of visible and mid-infrared scattering-type near-field optical microscopes," J. Microscopy 210, 311-314 (2003).
8. A. J. Huber, A. Ziegler, T. K̈ock, and R. Hillenband, "Infrared nanoscopy of strained semiconductors," Nature Nanotech. 4, 153-157 (2009).
9. A. Huber, N. Ocelíc, T. Taubner, and R. Hillenband, "Nanoscale resolved infrared probing of crystal structure and of plasmon-phonon coupling," Nano Lett. 6, 774-778 (2006).
10. N. Ocelíc and R. Hillenband, "Subwavelength-scale tailoring of surface phonon polaritons by focused ion-beam implantation," Nature Mat. 3, 606-609 (2004).
11. J. M. Stiegler, A. J. Huber, S. L. Diedenhofen, J. G. Rivas, R. E. Algra, E. P. A. M. Bakkers, and R. Hillenband, "Nanoscale free-carrier profiling of individual semiconductor nanowires by infrared near-field nanoscopy," Nano Lett. 10, 1387-1392 (2010).
12. M. B. Raschke and C. Lienau, "Apertureless near-field optical microscopy: Tip-sample coupling in elastic light scattering," Appl. Phys. Lett. 83, 5089-5091 (2003).
13. T. Taubner, F. Keilmann, and R. Hillenband, "Nanoscale-resolved subsurface imaging by scattering-type nearfield optical microscopy," Opt. Express 13, 8893-8899 (2005).
14. J. Aizpurua, T. Taubner, F. J. Garćia de Abajo, M. Brehm, and R. Hillenband, "Substrate-enhanced infrared near-field spectroscopy," Opt. Express 16, 1529-1545 (2008).
15. A. Cvitkovíc, N. Ocelíc, J. Aizpurua, R. Guckenberger, and R. Hillenbrand, "Infrared imaging of single nanoparticles via strong field enhancement in a scanning nanogap," Phys. Rev. Lett. 97, 060801 (2006).
16. A. Cvitkovíc, N. Ocelíc, and R. Hillenbrand, "Material-specific infrared recognition of single sub 10 nm particles by substrate-enhanced scattering-type near-field microscopy," Opt. Express 16, 7453-7459 (2008).
17. J. M. Stiegler, Y. Abate, A. Cvitkovíc, Y. E. Romanyuk, A. J. Huber, S. R. Leone, and R. Hillenband, "Nanoscale infrared absorption spectroscopy of individual nanoparticles enabled by scattering-type near-field microscopy," ACS Nano 5, 6494-6499 (2011).
18. M. Brehm, T. Taubner, R. Hillenband, and F. Keilmann, "Infrared spectroscopic mapping of single nanoparticles and viruses at nanoscale resolution," Nano Lett. 6, 1307-1310 (2006).
19. T. Taubner, D. Korobkin, Y. Urzhumov, G. Shvets, and R. Hillenband, "Near-field microscopy through a SiC superlens," Science 313, 1595-1595 (2006).
20. 2 interface," Nano Lett. 11, 4701-4705 (2011).
21. L. M. Zhang, G. O. Andreev, Z. Fei, A. S. McLeod, G. Dominguez, M. Thiemens, A. H. Castro-Neto, D. N. Basov, and M. M. Fogler, "Near-field spectroscopy of silicon dioxide thin films," Phys. Rev. B 85, 075419 (2012).
22. B. B. Akhremitchev, Y. Sun, L. Stebounova, and G. C. Walker, "Monolayer-sensitive infrared imaging of DNA stripes using apertureless near-field optical microscopy," Langmuir 18, 5325-5328 (2002).
23. I. Kopf, J.-S. Samson, G. Wollny, C. Grunwald, E. Br̈udermann, and M. Havenith, "Chemical imaging of microstructured self-assembled monolayers with nanometer resolution," J. Phys. Chem. C 111, 8166-8171 (2007).
24. G. Wollny, E. Br̈udermann, Z. Arsov, L. Quaroni, and M. Havenith, "Nanoscale depth resolution in scanning near-field infrared microscopy," Opt. Express 16, 7453-7459 (2008).
25. J. Sun, J. C. Schotland, R. Hillenbrand, and P. S. Carney, "Nanoscale optical tomography using volume-scanning near-field microscopy," Appl. Phys. Lett. 95, 121108 (2009).
26. A. A. Govyadinov, G. Y. Panasyuk, and J. C. Schotland, "Phaseless three-dimensional optical nanoimaging," Phys. Rev. Lett. 103, 213901 (2009).
27. A. Cvitkovíc, N. Ocelíc, and R. Hillenbrand, "Analytical model for quantitative prediction of material contrasts in scattering-type near-field optical microscopy," Opt. Express 16, 8550-8565 (2007).
28. N. Ocelíc, "Quantitative near-field phonon-polariton spectroscopy," Dissertation, TU M̈unchen (2007), Chapters 5 and 6.
29. M. Nonnenmacher, M. P. O'Boyle, and H. K. Wickramasinghe, "Kelvin probe force microscopy," Appl. Phys. Lett. 58, 2921-2923 (1991).
30. M. Brehm, A. Schliesser, F. Cajko, I. Tsukerman, and F. Keilmann, "Antenna-mediated back-scattering efficiency in infrared near-field microscopy," Opt. Express 16, 11203-11215 (2008).
31. B. Knoll and F. Keilmann, "Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy," Opt. Commun. 182, 321-328 (2000).
32. J. Renger, S. Grafstr̈om, L. M. Eng, and R. Hillenbrand, "Resonant light scattering by near-field-induced phonon polaritons," Phys. Rev. B 71, 075410 (2005).
33. R. Esteban, R. Vogelgesang, and K. Kern, "Full simulations of the apertureless scanning near field optical microscopy signal: achievable resolution and contrast," Opt. Express 17, 2518-2529 (2009).
34. K. Moon, E. Jung, M. Lim, Y. Do, and H. Han, "Quantitative analysis and measurements of near-field interactions in terahertz microscopes," Opt. Express 19, 11539-11544 (2011).
35. J. D. Jackson, Classical Electrodynamics, 3rd ed. (Wiley, 1999), Section 4.4.
36. M. Brehm, "Infrarot-Mikroskopie mit einem Nahfeldmikroskop," Dissertation, TU M̈unchen (2006), Chap. 4.
37. B. Wang and C. H. Woo, "Atomic force microscopy-induced electric field in ferroelectric thin films," J. Appl. Phys. 94, 4053-4059 (2003).
38. E. D. Palik, Handbook of Optical Constants of Solids (Academic Press, New York, 1985).
39. T. Taubner, R. Hillenbrand, and F. Keilmann, "Nanoscale polymer recognition by spectral signature in scattering infrared near-field microscopy," Appl. Phys. Lett. 85, 5064-5066 (2004).
40. L. Novotny, B. Hecht, and D. W. Pohl, "Implications of high resolution to near-field optical microscopy," Ultramicroscopy 71, 341-344 (1998).
41. R. Krutokhvostov, A. A. Govyadinov, J. M. Stiegler, F. Huth, A. Chuvilin, P. S. Carney, and R. Hillenbrand, "Enhanced resolution in subsurface near-field optical microscopy," Opt. Express 20, 593-600 (2012).
42. F. Demming, J. Jersch, K. Dickmann, and P. I. Geshev, "Calculation of the field enhancement on laser-illuminated scanning probe tips by the boundary element method," Appl. Phys. B 66, 593-598 (1998).
43. N. Behr and M. Raschke, "Optical antenna properties of scanning probe tips: Plasmonic light scattering, tip-sample coupling, and near-field enhancement," J. Phys. Chem. C 112, 3766-3773 (2008).
44. F. Huth, M. Schnell, J. Wittborn, N. Ocelíc, and R. Hillenband, "Infrared-spectroscopic nanoimaging with a thermal source," Nature Mat. 10, 352-356 (2011).
45. S. Amarie and F. Keilmann, "Broadband-infrared assessment of phonon resonance in scattering-type near-field microscopy," Phys. Rev. B 83, 045404 (2011).
46. R. Hillenbrand, T. Taubner, and F. Keilmann, "Phonon-enhanced light-matter interaction at the nanometre scale," Nature (London) 418, 159-162 (2002).
47. T. Taubner, F. Keilmann, and R. Hillenbrand, "Nanomechanical resonance tuning and phase effects in optical near-field interaction," Nano Lett. 4, 1669-1672 (2004).
48. J. A. Porto, P. Johansson, S. P. Apell, and T. Ĺopez-Ŕios, "Resonance shift effects in apertureless scanning nearfield optical microscopy," Phys. Rev. B 67, 085409 (2003).