Near-field microscopy through a SiC superlens

Science

Volumn 313, Issue 5793, 2006, Pages 1595-

  Taubner, Thomas ^a,c   Korobkin, Dmitriy ^b   Urzhumov, Yaroslav ^b   Shvets, Gennady ^b   Hillenbrand, Rainer ^a  

^a MAX PLANCK INSTITUTE OF BIOCHEMISTRY   (Germany)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^c Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGICAL MATERIALS; IMAGING TECHNIQUES; LENSES; MOLECULAR STRUCTURE; SILICON CARBIDE;

BIOLOGICAL OBJECTS; INTERNAL STRUCTURE; SUPERLENS;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

IMAGING METHOD; MICROSCOPY; WAVELENGTH;

ARTICLE; ELECTROMAGNETIC FIELD; ILLUMINATION; IMAGE ANALYSIS; MATERIAL COATING; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 33748805499     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1131025     Document Type: Article

References (10)

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10. We thank C. Zorman for SiC epitaxy. This work was funded by Deutsches Bundesministerium für Bildung und Forschung (Nachwuchswettbewerb Nanotechnologie 2002), grant number 03N8705, and in part by the Multi-University Research Initiatives of the Army Research Office (grant no. W911NF-04-01-0203) and the Air Force Office of Research (grant no. FA 9550-06-01-0279).