Implications of high resolution to near-field optical microscopy

Ultramicroscopy

Volumn 71, Issue 1-4, 1998, Pages 341-344

  Novotny, Lukas ^a   Hecht, Bert ^b   Pohl, Dieter W ^c  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^b ETH ZURICH   (Switzerland)

^c IBM RESEARCH ZURICH   (Switzerland)

Author keywords

Nanotechnology; Near field optics; Scanning near field optical microscopy

Indexed keywords

DIFFRACTION; NANOTECHNOLOGY; OPTICAL PROPERTIES; OPTICS;

ARTIFACTS; NEAR FIELD OPTICAL MICROSCOPY; OPTICAL FIELDS;

OPTICAL MICROSCOPY;

ARTICLE; DIFFRACTION; IMAGE QUALITY; IMAGE RECONSTRUCTION; MICROSCOPY; OPTICS; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 0032033246     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00066-1     Document Type: Article

References (6)

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