Atomic force microscopy-induced electric field in ferroelectric thin films

Journal of Applied Physics

Volumn 94, Issue 6, 2003, Pages 4053-4059

  Wang, Biao ^a,b   Woo, C H ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^b HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; GREEN'S FUNCTION; POLARIZATION; SUBSTRATES;

FERROELECTRIC DOMAINS;

FERROELECTRIC THIN FILMS;

EID: 0141990523     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1603345     Document Type: Article

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