Subwavelength-scale tailoring of surface phonon polaritons by focused ion-beam implantation

Nature Materials

Volumn 3, Issue 9, 2004, Pages 606-609

  Ocelic, N ^a   Hillenbrand, R ^a  

^a MAX PLANCK INSTITUTE OF BIOCHEMISTRY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; CRYSTAL STRUCTURE; ELECTRIC INSULATORS; ELECTROMAGNETIC FIELDS; ELECTROMAGNETIC WAVE PROPAGATION; ELECTROMAGNETIC WAVES; ION IMPLANTATION; LATTICE VIBRATIONS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; SEMICONDUCTOR MATERIALS; SILICON CARBIDE; SURFACE PLASMON RESONANCE;

FOCUSED ION-BEAM IMPLANTATION; NANOPHOTONIC APPLICATIONS; POLAR CRYSTALS; SURFACE PHONON POLARITONS;

NANOTECHNOLOGY;

INORGANIC COMPOUND; ION; SILICON CARBIDE; SILICON DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; EVALUATION; MATERIALS; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PHOTOCHEMISTRY; PHOTON; SURFACE PROPERTY; VIBRATION;

CARBON COMPOUNDS, INORGANIC; CRYSTALLIZATION; IONS; MANUFACTURED MATERIALS; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MOLECULAR CONFORMATION; NANOTECHNOLOGY; PHOTOCHEMISTRY; PHOTONS; SILICON COMPOUNDS; SURFACE PROPERTIES; VIBRATION;

EID: 4444249563     PISSN: 14761122     EISSN: None     Source Type: Journal    
DOI: 10.1038/nmat1194     Document Type: Article

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