Enhanced resolution in subsurface near-field optical microscopy

Optics Express

Volumn 20, Issue 1, 2012, Pages 593-600

  Krutokhvostov, Roman ^a   Govyadinov, Alexander A ^a   Stiegler, Johannes M ^a   Huth, Florian ^a,b   Chuvilin, Andrey ^a,c   Carney, P Scott ^a,d   Hillenbrand, Rainer ^a,c  

^a CIC NANOGUNE   (Spain)

^b Neaspec GmbH   (Germany)

^c BASQUE FOUNDATION FOR SCIENCE   (Spain)

^d UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL DATA STORAGE;

DIPOLE MODEL; EXPERIMENTAL ANALYSIS; HIGHER HARMONICS; NEAR FIELD OPTICAL MICROSCOPY; NEAR-FIELD; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SPATIAL RESOLUTION; SUBSURFACE FEATURES;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; IMAGE ENHANCEMENT; METHODOLOGY; MICROSCOPY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

ALGORITHMS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MICROSCOPY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 84855431748     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.000593     Document Type: Article

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