Nanoscale infrared absorption spectroscopy of individual nanoparticles enabled by scattering-type near-field microscopy

ACS Nano

Volumn 5, Issue 8, 2011, Pages 6494-6499

  Stiegler, Johannes M ^a   Abate, Yohannes ^b,c   Cvitkovic, Antonija ^d   Romanyuk, Yaroslav E ^b   Huber, Andreas J ^d   Leone, Stephen R ^b,c   Hillenbrand, Rainer ^a,e  

^a CIC NANOGUNE   (Spain)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^d Neaspec GmbH   (Germany)

^e BASQUE FOUNDATION FOR SCIENCE   (Spain)

Author keywords

chemical identification; infrared absorption spectroscopy; nanoparticles; nanoscale resolution; phase contrast; scattering type near field microscopy

Indexed keywords

CHEMICAL COMPOSITIONS; CHEMICAL IDENTIFICATION; CHEMICAL MAPPING; DIFFRACTION LIMITS; FAR-FIELD; LINEAR SCALING; NANO SCALE; NANO-ISLANDS; NANO-METER-SCALE; NANOSCALE RESOLUTIONS; NEAR FIELD MICROSCOPY; NEAR FIELD PROBES; NEAR-FIELD; NEAR-FIELD COUPLING; PHASE CONTRASTS; PHASE SPECTRA; SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY (S-SNOM); SMALL PARTICLES; SPATIAL RESOLUTION; THEORETICAL MODELS;

ABSORPTION; CHEMICAL ANALYSIS; INFRARED ABSORPTION; LIGHT ABSORPTION; NANOPARTICLES; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; NEAR FIELD SCANNING OPTICAL MICROSCOPY; PHOTOMAPPING; SCATTERING; SILICON NITRIDE;

ABSORPTION SPECTROSCOPY;

NANOPARTICLE; SILICON DERIVATIVE; SILICON NITRIDE;

ABSORPTION; ARTICLE; CHEMISTRY; INFRARED SPECTROPHOTOMETRY; INTERFEROMETRY; LIGHT; LIGHT RELATED PHENOMENA; METHODOLOGY; MICROSCOPY; NANOTECHNOLOGY; RADIATION SCATTERING; VIBRATION;

ABSORPTION; INTERFEROMETRY; LIGHT; MICROSCOPY; NANOPARTICLES; NANOTECHNOLOGY; OPTICAL PROCESSES; SCATTERING, RADIATION; SILICON COMPOUNDS; SPECTROPHOTOMETRY, INFRARED; VIBRATION;

EID: 80052064773     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn2017638     Document Type: Article

References (36)

1. Keilmann, F.; Hillenbrand, R. Near-Field Microscopy by Elastic Light Scattering from a Tip Philos. Trans. R. Soc. A 2004, 362, 787-805 (Pubitemid 38430597)
2. Huber, A. J.; Keilmann, F.; Wittborn, J.; Aizpurua, J.; Hillenbrand, R. Terahertz Near-Field Nanoscopy of Mobile Carriers in Single Semiconductor Nanodevices Nano Lett. 2008, 8, 3766-3770
3. Sanchez, E. J.; Novotny, L.; Xie, X. S. Near-Field Fluorescence Microscopy Based on Two-Photon Excitation with Metal Tips Phys. Rev. Lett. 1999, 82, 4014-4017 (Pubitemid 129689356)
4. Cvitkovic, A.; Ocelic, N.; Aizpurua, J.; Guckenberger, R.; Hillenbrand, R. Infrared Imaging of Single Nanoparticles Via Strong Field Enhancement in a Scanning Nanogap Phys. Rev. Lett. 2006, 97, 060801
5. Brehm, M.; Schliesser, A.; Cajko, F.; Tsukerman, I.; Keilmann, F. Antenna-Mediated Back-Scattering Efficiency in Infrared Near-Field Microscopy Opt. Express 2008, 16, 11203-11215
6. Huber, A. J.; Ziegler, A.; Kock, T.; Hillenbrand, R. Infrared Nanoscopy of Strained Semiconductors Nat. Nanotechnol. 2009, 4, 153-157
7. Kehr, S. C.; Cebula, M.; Mieth, O.; Haertling, T.; Seidel, J.; Grafstroem, S.; Eng, L. M.; Winnerl, S.; Stehr, D.; Helm, M. Anisotropy Contrast in Phonon-Enhanced Apertureless Near-Field Microscopy Using a Free-Electron Laser Phys. Rev. Lett. 2008, 100, 256403
8. Cvitkovic, A.; Ocelic, N.; Hillenbrand, R. Material-Specific Infrared Recognition of Single Sub-10 nm Particles by Substrate-Enhanced Scattering-Type Near-Field Microscopy Nano Lett. 2007, 7, 3177-3181 (Pubitemid 350132949)
9. Akhremitchev, B. B.; Sun, Y.; Stebounova, L.; Walker, G. C. Monolayer-Sensitive Infrared Imaging of DNA Stripes Using Apertureless Near-Field Microscopy Langmuir 2002, 18, 5325-5328 (Pubitemid 35383430)
10. Arsov, Z.; Quaroni, L.; Havenith, M. Nanoscale Depth Resolution in Scanning Near-Field Infrared Microscopy Opt. Express 2008, 16, 7453-7459 (Pubitemid 351697430)
11. Ogawa, Y.; Minami, F.; Abate, Y.; Leone, S. R. Nanometer-Scale Dielectric Constant of Ge Quantum Dots Using Apertureless Near-Field Scanning Optical Microscopy Appl. Phys. Lett. 2010, 96, 063107
12. Raschke, M. B.; Molina, L.; Elsaesser, T.; Kim, D. H.; Knoll, W.; Hinrichs, K. Apertureless Near-Field Vibrational Imaging of Block-Copolymer Nanostructures with Ultrahigh Spatial Resolution ChemPhysChem 2005, 6, 2197-2203 (Pubitemid 41503711)
13. Stiegler, J. M.; Huber, A. J.; Diedenhofen, S. L.; Gomez Rivas, J.; Algra, R. E.; Bakkers, E. P. A. M.; Hillenbrand, R. Nanoscale Free-Carrier Profiling of Individual Semiconductor Nanowires by Infrared Near-Field Nanoscopy Nano Lett. 2010, 10, 1387-1392
14. Knoll, B.; Keilmann, F. Infrared Conductivity Mapping for Nanoelectronics Appl. Phys. Lett. 2000, 77, 3980-3982
15. Samson, J.-S.; Wollny, G.; Brundermann, E.; Bergner, A.; Hecker, A.; Schwaab, G.; Dirk Wieck, A.; Havenith, M. Setup of a Scanning Near Field Infrared Microscope (SNIM): Imaging of Sub-Surface Nano-Structures in Gallium-Doped Silicon Phys. Chem. Chem. Phys. 2006, 8, 753-758
16. 2 Revealed by Infrared Spectroscopy and Nano-Imaging Science 2007, 318, 1750-1753 (Pubitemid 350284506)
17. Aizpurua, J.; Taubner, T.; García de Abajo, F. J.; Brehm, M.; Hillenbrand, R. Substrate-Enhanced Infrared Near-Field Spectroscopy Opt. Express 2008, 16, 1529-1545 (Pubitemid 351246294)
18. Neacsu, C. C.; Dreyer, J.; Behr, N.; Raschke, M. Scanning-Probe Raman Spectroscopy with Single-Molecule Sensitivity Phys. Rev. B 2006, 73, 193406
19. Pettinger, B.; Ren, B.; Picardi, G.; Schuster, R.; Ertl, G. Nanoscale Probing of Adsorbed Species by Tip-Enhanced Raman Spectroscopy Phys. Rev. Lett. 2004, 92, 096101
20. Deckert-Gaudig, T.; Bailo, E.; Deckert, V. Tip-Enhanced Raman Scattering (TERS) of Oxidised Glutathione on an Ultraflat Gold Nanoplate Phys. Chem. Chem. Phys. 2009, 11, 7360-7362
21. 2-Microglobulin Fragment Using Near-Field Infrared Spectroscopy J. Am. Chem. Soc. 2011, 133, 7376-7383
22. Knoll, B.; Keilmann, F. Enhanced Dielectric Contrast in Scattering-Type Scanning Near-Field Optical Microscopy Opt. Commun. 2000, 182, 321-328
23. Cvitkovic, A.; Ocelic, N.; Hillenbrand, R. Analytical Model for Quantitative Prediction of Material Contrasts in Scattering-Type Near-Field Optical Microscopy Opt. Express 2007, 15, 8550-8565 (Pubitemid 47112466)
24. Brehm, M.; Taubner, T.; Hillenbrand, R.; Keilmann, F. Infrared Spectroscopic Mapping of Single Nanoparticles and Viruses at Nanoscale Resolution Nano Lett. 2006, 6, 1307-1310 (Pubitemid 44195300)
25. Parsons, G. N.; Souk, J. H.; Batey, J. Low Hydrogen Content Stoichiometric Silicon Nitride Films Deposited by Plasma-Enhanced Chemical Vapor Deposition J. Appl. Phys. 1991, 70, 1553-1560
26. Ocelic, N.; Huber, A.; Hillenbrand, R. Pseudoheterodyne Detection for Background-Free Near-Field Spectroscopy Appl. Phys. Lett. 2006, 89, 101124
27. Kim, Z. H.; Ahn, S.-H.; Liu, B.; Leone, S. R. Nanometer-Scale Dielectric Imaging of Semiconductor Nanoparticles: Size-Dependent Dipolar Coupling and Contrast Reversal Nano Lett. 2007, 7, 2258-2262 (Pubitemid 47310116)
28. Taubner, T.; Hillenbrand, R.; Keilmann, F. Nanoscale Polymer Recognition by Spectral Signature in Scattering Infrared Near-Field Microscopy Appl. Phys. Lett. 2004, 85, 5064-5066 (Pubitemid 40715215)
29. Cvitkovic, A. Substrate-Enhanced Scattering-Type Scanning Near-Field Infrared Microscopy of Nanoparticles. Ph.D. Thesis, Technische Universität München, München, 2009.
30. Jackson, J. D. Classical Electrodynamics, 3rd ed.; Wiley: New York, 1999.
31. Brendel, R.; Bormann, D. An Infrared Dielectric Function Model for Amorphous Solids J. Appl. Phys. 1992, 71, 1-6
32. Bohren, C. F.; Huffmann, D. R. Absorption and Scattering of Light by Small Particles; Wiley: New York, 1983.
33. Weber-Bargioni, A.; Schwartzberg, A.; Cornaglia, M.; Ismach, A.; Urban, J. J.; Pang, Y.; Gordon, R.; Bokor, J.; Salmeron, M. B.; Ogletree, D. F. et al. Hyperspectral Nanoscale Imaging on Dielectric Substrates with Coaxial Optical Antenna Scan Probes Nano Lett. 2011, 11, 1201-1207
34. Zou, Y.; Steinvurzel, P.; Yang, T.; Crozier, K. B. Surface Plasmon Resonances of Optical Antenna Atomic Force Microscope Tips Appl. Phys. Lett. 2009, 94, 171107
35. De Angelis, F.; Das, G.; Candeloro, P.; Patrini, M.; Galli, M.; Bek, A.; Lazzarino, M.; Maksymov, I.; Liberale, C.; Andreani, L. C. et al. Nanoscale Chemical Mapping Using Three-Dimensional Adiabatic Compression of Surface Plasmon Polaritons Nat. Nanotechnol. 2010, 5, 67-72
36. Palermo, V.; Jones, D. Self-Organised Growth of Silicon Structures on Silicon During Oxide Desorption Mater. Sci. Eng., B 2002, 88, 220-224