Antenna-mediated back-scattering efficiency in infrared near-field microscopy

Optics Express

Volumn 16, Issue 15, 2008, Pages 11203-11215

  Brehm, M ^a   Schliesser, A ^b   Cajko F ^c   Tsukerman, I ^c   Keilmann, F ^a  

^a MAX PLANCK INSTITUTE OF BIOCHEMISTRY   (Germany)

^b MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

^c The University of Akron   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANTENNAS; ATOMIC FORCE MICROSCOPY; DIELECTRIC PROPERTIES; EFFICIENCY; ELECTROMAGNETIC WAVE POLARIZATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PHONONS; PHOTONS; PROBES; QUANTUM THEORY; SILICON CARBIDE; SURFACE PLASMON RESONANCE;

COHERENT FREQUENCY; FAR-FIELD SCATTERING; FOURIER TRANSFORM SPECTROSCOPY; FRESNEL REFLECTIVITY; NEAR FIELD MICROSCOPY; SURFACE PHONON-POLARITONS; SURFACE PLASMON POLARITONS; THREE ORDERS OF MAGNITUDE;

BACKSCATTERING;

ARTICLE; ATOMIC FORCE MICROSCOPY; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; EQUIPMENT; EQUIPMENT DESIGN; INFRARED RADIATION; INSTRUMENTATION; LIGHT; METHODOLOGY; RADIATION SCATTERING; REFRACTOMETRY; THEORETICAL MODEL;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INFRARED RAYS; LIGHT; MICROSCOPY, ATOMIC FORCE; MODELS, THEORETICAL; REFRACTOMETRY; SCATTERING, RADIATION;

EID: 47849127692     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.011203     Document Type: Article

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