Full simulations of the apertureless scanning near field optical microscopy signal: Achievable resolution and contrast

Optics Express

Volumn 17, Issue 4, 2009, Pages 2518-2529

  Esteban, R ^a,b   Vogelgesang, R ^a   Kern, K ^a,c  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b INSTITUT D'OPTIQUE GRADUATE SCHOOL   (France)

^c EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DEMODULATION; MAXWELL EQUATIONS; OPTICAL VARIABLES MEASUREMENT; SCANNING;

APERTURELESS SCANNING; EXPERIMENTAL PARAMETERS; INTERFEROMETRIC DETECTION; NEAR-FIELD OPTICAL IMAGING; OSCILLATION AMPLITUDE; QUANTITATIVE SIMULATION; SCANNING CONDITIONS; STRUCTURED SUBSTRATE;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; EVALUATION; IMAGE ENHANCEMENT; LIGHT; METHODOLOGY; RADIATION SCATTERING; REPRODUCIBILITY; SCANNING PROBE MICROSCOPY; SENSITIVITY AND SPECIFICITY; THEORETICAL MODEL;

ALGORITHMS; COMPUTER SIMULATION; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; LIGHT; MICROSCOPY, SCANNING PROBE; MODELS, THEORETICAL; REPRODUCIBILITY OF RESULTS; SCATTERING, RADIATION; SENSITIVITY AND SPECIFICITY;

EID: 60549103080     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.002518     Document Type: Article

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