Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications, Second Edition

Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications, Second Edition

Volumn , Issue , 2011, Pages

  Friedbacher, Gernot ^a   Bubert, Henning ^b,c  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b LEIBNIZ INSTITUT FÜR ANALYTISCHE WISSENSCHAFTEN ISAS E V   (Germany)

^c NONE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

SCANNING PROBE MICROSCOPY;

AMERICAN CHEMICAL SOCIETY; ANALYTICAL CHEMISTS; EQUIPMENT SUPPLIERS; MATERIALS SCIENTIST; PHOTON DETECTION; SUM FREQUENCY GENERATION; SURFACE TECHNOLOGY; THIN FILM ANALYSIS;

THIN FILMS;

EID: 85099488168     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527636921     Document Type: Book

References (0)