Scanning probe microscopy of graphene

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 44, Issue 4, 2012, Pages 743-759

  Deshpande, Aparna ^a   Leroy, Brian J ^b  

^a INDIAN INSTITUTE OF SCIENCE EDUCATION AND RESEARCH   (India)

^b University of Arizona   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE ENGINEERING; FUNDAMENTAL PROPERTIES; INDISPENSABLE TOOLS; THEORETICAL INVESTIGATIONS;

ELECTRONIC PROPERTIES; MONOLAYERS; RESEARCH; SCANNING PROBE MICROSCOPY;

GRAPHENE;

EID: 84855876912     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2011.11.024     Document Type: Review

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