Atomic structure of graphene on SiO 2

Nano Letters

Volumn 7, Issue 6, 2007, Pages 1643-1648

  Ishigami, Masa ^a,b   Chen, J H ^a,b   Cullen, W G ^a,b   Fuhrer, M S ^b   Williams, E D ^a,b  

^a UNIVERSITY OF MARYLAND   (United States)

^b University of Maryland   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC DEVICES; GRAPHENE; GRAPHITIC LATTICE; PHOTORESIST RESIDUES;

CRYSTAL ATOMIC STRUCTURE; LITHOGRAPHY; PERTURBATION TECHNIQUES; PHOTORESISTS; SCANNING TUNNELING MICROSCOPY; SILICA;

GRAPHITE;

GRAPHITE; NANOMATERIAL; SILICON DIOXIDE;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; INSTRUMENTATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; GRAPHITE; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SILICON DIOXIDE; SURFACE PROPERTIES;

EID: 34547310313     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl070613a     Document Type: Article

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