Observing the quantization of zero mass carriers in graphene

Science

Volumn 324, Issue 5929, 2009, Pages 924-927

  Miller, David L ^a   Kubista, Kevin D ^a   Rutter, Gregory M ^b   Ruan, Ming ^a   De Heer, Walt A ^a   First, Phillip N ^a   Stroscio, Joseph A ^b  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAPHENE; SILICON CARBIDE;

DETECTION METHOD; GAS; MAGNETIC FIELD; MAPPING METHOD; SCANNING TUNNELLING MICROSCOPY;

ARTICLE; CONDUCTANCE; CONDUCTOR; CYCLOTRON; ELECTRICITY; ELECTRON; ENERGY; GAS; MAGNETIC FIELD; OSCILLATION; PHOTON; PRIORITY JOURNAL; SCANNING TUNNELING MICROSCOPY; VELOCITY;

EID: 67649322449     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1171810     Document Type: Article

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34. We thank A. MacDonald, H. Min, M. Stiles, and the NIST graphene team for valuable comments and discussions and C.Berger,N.Sharma,M.Sprinkle,S. Blankenship, A. Band, and F. Hess for their technical contributions to this work. Portions of this work were supported by NSF (grant ECCS-0804908), the Semiconductor Research Corporation Nanoelectronics Research Initiative (INDEX program), and the W. M. Keck Foundation. Graphene production facilities were developed under NSF grant ECCS-0521041.